Journal ArticleDOI
A Monte Carlo approach for maximum power estimation based on extreme value theory
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A Monte Carlo approach for maximum power estimation in CMOS very large scale integration (VLSI) circuits is proposed, based on the largely unexploited area of statistics known as extreme value theory, which features a relatively small number of necessary input patterns that does not depend on the circuit size, user-specified accuracy, and confidence levels.Abstract:
A Monte Carlo approach for maximum power estimation in CMOS very large scale integration (VLSI) circuits is proposed. The approach is based on the largely unexploited area of statistics known as extreme value theory. Within this framework, it attempts to appropriately model the extreme behavior of the probability distribution of the peak instantaneous power drawn from the power supply bus, in order to yield a close estimate of its maximum possible value. The approach features a relatively small number of necessary input patterns that does not depend on the circuit size, user-specified accuracy, and confidence levels for the final estimate, simplicity in the algorithmic implementation, noniterative single-loop execution, highly accurate simulation-based operation, and easy integration within the design flow of CMOS VLSI circuits. Experimental results establish the above claims and demonstrate the overall efficiency of the proposed approach to address the problem of maximum power estimation.read more
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References
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Book
Practical Methods of Optimization
TL;DR: The aim of this book is to provide a Discussion of Constrained Optimization and its Applications to Linear Programming and Other Optimization Problems.
Journal ArticleDOI
Statistical Inference Using Extreme Order Statistics
TL;DR: In this article, a method for making statistical inferences about the upper tail of a distribution function is presented for estimating the probabilities of future extremely large observations, where the underlying distribution function satisfies a condition which holds for all common continuous distribution functions.
Book
Monte Carlo: Concepts, Algorithms, and Applications
TL;DR: This paper presents a meta-modelling framework that automates the very labor-intensive and therefore time-heavy and expensive process of manually cataloging samples and generating random numbers.
Journal ArticleDOI
The Asymptotic Theory of Extreme Order Statistics
TL;DR: In this paper, the authors analyze the recent development of the theory of the asymptotic distribution of extremes in the light of the questions (i) and (ii). Several dependence concepts will be introduced, each of which leads to a solution of (i).
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