Journal ArticleDOI
A new on-chip digital BIST for analog-to-digital converters
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TLDR
A fully digital built-in self-test for analog-to-digital converters is presented, capable of measuring the DNL, INL, offset error and gain error, and mainly consists of several registers and some digital subtracters.About:
This article is published in Microelectronics Reliability.The article was published on 1998-03-27. It has received 11 citations till now. The article focuses on the topics: Digital electronics & Built-in self-test.read more
Citations
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Proceedings ArticleDOI
Structural testing of pipelined analog to digital converters
TL;DR: Two alternative BIST schemes for structural testing of pipelined ADCs based on testing each of the ADC stages reconfigured as an A/D-D/A block and applying as input a set of analog values are presented.
Journal ArticleDOI
A method of fault diagnosis of analog parts of electronic embedded systems with tolerances
TL;DR: In this paper, a fault detection and localization method for analog parts with tolerances of non-faulty elements in embedded mixed-signal systems controlled by microcontrollers is presented.
Journal ArticleDOI
Oscillation-based test in bandpass oversampled A/D converters
TL;DR: In this article, the authors extended a study performed by the authors in previous papers dealing with the OBT approach applied to low-pass modulators, showing the specific features associated to the bandpass case.
Oscillation-based test in bandpass oversampled A/D converters
TL;DR: The specific features associated to the bandpass case are shown, and a practical feedback strategy will be proposed in order to built an effective oscillator, which can be valuable for testing purposes.
Journal ArticleDOI
Oscillation-based test in oversampled ΣΔ modulators
TL;DR: In this article, a way of applying the oscillation-based test (OBT)/oscillation-based built-in-self test concept to oversampled ΣΔ modulators, exploiting previous experience coined through the implementation of OBT in SC integrated filters is discussed.
References
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Journal ArticleDOI
Dynamic testing and diagnostics of A/D converters
TL;DR: In this article, a method is derived to measure the integral and differential nonlinearity of an ADC using a sinewave with unknown amplitude and offset, and the uncertainty of the measurement is also estimated.
Proceedings ArticleDOI
Design for testability of mixed signal integrated circuits
TL;DR: A starting point for a set of design for testability (DFT) principles that can be used with mixed signal integrated circuits is presented, arguing that an effective DFT technique should enhance the ability to perform digital signal processing and other modern test techniques on analog macros embedded in the integrated circuit.
Proceedings ArticleDOI
A built-in self-test for ADC and DAC in a single-chip speech CODEC
Eiichi Teraoka,Toru Kengaku,Ikuo Yasui,K. Ishikawa,Takahiro Matsuo,H. Wakada,Narumi Sakashita,Yukihiko Shimazu,T. Tokuda +8 more
TL;DR: Built-in self-test (BIST) has been applied to test an analog to digital converter (ADC) and a digital to analog converter (DAC) embedded in a DSP-core ASIC and the measured results have shown good agreement with measured results by conventional tests.
Proceedings ArticleDOI
A new built-in self-test approach for digital-to-analog and analog-to-digital converters
TL;DR: In this article, the authors proposed a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-todigital (A/D) converters.
Proceedings ArticleDOI
Fast accurate and complete ADC testing
TL;DR: It is concluded that the proposed tally-weight-servo processor adds significantly to the ability of a system to verify the accuracy performance of ADCs.