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Proceedings ArticleDOI

A novel 75 GHz InP HEMT dynamic divider

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TLDR
In this paper, a dynamic frequency divider IC is realized by injection locking a broadly tunable push-pull oscillator using a simple pumped-delay model of a two-stage ring oscillator.
Abstract
A novel dynamic frequency divider IC is realized by injection locking a broadly tunable push-pull oscillator. The injection locking process is explained using a simple pumped-delay model of a two-stage ring oscillator. Two different dynamic dividers were fabricated in the Hughes 0.1 /spl mu/m gate-length InP HEMT process. The first covers 15-68 GHz while the second operates over the entire band from 50 to 75 GHz.

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Citations
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Proceedings ArticleDOI

70GHz CMOS Harmonic Injection-Locked Divider

TL;DR: A 70GHz CMOS harmonic injection-locked divider (HILD) is presented, where a third-harmonic mixer is realized by a differential-voltage-driven MOSFET.
Proceedings ArticleDOI

20 GHz CMOS injection-locked frequency divider with variable division ratio

TL;DR: In this article, an injection-locked frequency divider with variable division ratio, controlled by the input offset voltage, was realized using a 0.13 /spl mu/m CMOS technology.
Proceedings ArticleDOI

82 GHz dynamic frequency divider in 5.5 ps ECL SiGe HBTs

TL;DR: In this article, a self-aligned selective-epitaxial-growth (SEG) SiGe heterojunction bipolar transistors (HBTs) are fabricated in selfaligned SEG SiGe HBTs with a 122 GHz cutoff frequency, a 163 GHz maximum oscillation frequency, and 5.5 ps ECL gate delay.
Proceedings ArticleDOI

A 79 GHz dynamic frequency divider in SiGe bipolar technology

TL;DR: This regenerative frequency divider exploits the high-speed potential of SiGe technologies to combine high maximum frequency with operation over wide frequency range.
References
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Proceedings ArticleDOI

Jitter in ring oscillators

TL;DR: A theoretical framework for analyzing and predicting jitter in ring oscillators is described, considering each delay stage to add a uniform amount of phase in a varying an amount of time.
Journal ArticleDOI

Microwave performance of AlInAs-GaInAs HEMTs with 0.2- and 0.1- mu m gate length

TL;DR: In this paper, the millimeter-wave performance of high-electron-mobility transistors (HEMTs) with 0.2- mu m and 0.1-mu m-long gates on material grown by molecular-beam epitaxy on semi-insulating InP substrates was investigated.
Journal ArticleDOI

39.5-GHz static frequency divider implemented in AlInAs/GaInAs HBT technology

TL;DR: In this paper, a static divide-by-4 frequency divider operating at 39.5 GHz with a corresponding gate delay of 12.6 ps was implemented using InP-based HBT technology.
Proceedings ArticleDOI

39.5-GHz static frequency divider implemented in AlInAs/GaInAs HBT technology

TL;DR: In this article, a static divide-by-four frequency divider operating at 395 GHz input frequency is reported, with a very low turn-on voltage of about 07 V at collector current density of 5*10/sup 4/ A/cm/sup 2/
Journal ArticleDOI

Residual phase noise measurements of VHF, UHF, and microwave components

TL;DR: In this article, the results of residual phase noise measurements on a number of VHF, UHF, and microwave amplifiers, both silicon (Si) bipolar junction transistor (BJT) and gallium arsenide (GaAs) field effect transistor (FET) based, electronic phase shifters, frequency dividers and multipliers, etc., which are commonly used in a wide variety of frequency source and synthesizer applications are presented.
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