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Artificial semiconductor/insulator superlattice channel structure for high-performance oxide thin-film transistors.

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TLDR
The enhanced field effect mobility and stability obtained for the superlattice TFT devices were explained on the basis of layer-by-layer growth mode, improved crystalline nature of the channel layers, and passivation effect of Al2O3 layers.
Abstract
High-performance thin-film transistors (TFTs) are the fundamental building blocks in realizing the potential applications of the next-generation displays. Atomically controlled superlattice structures are expected to induce advanced electric and optical performance due to two-dimensional electron gas system, resulting in high-electron mobility transistors. Here, we have utilized a semiconductor/insulator superlattice channel structure comprising of ZnO/Al2O3 layers to realize high-performance TFTs. The TFT with ZnO (5 nm)/Al2O3 (3.6 nm) superlattice channel structure exhibited high field effect mobility of 27.8 cm2/Vs, and threshold voltage shift of only < 0.5 V under positive/negative gate bias stress test during 2 hours. These properties showed extremely improved TFT performance, compared to ZnO TFTs. The enhanced field effect mobility and stability obtained for the superlattice TFT devices were explained on the basis of layer-by-layer growth mode, improved crystalline nature of the channel layers, and passivation effect of Al2O3 layers.

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Journal ArticleDOI

New development of atomic layer deposition: processes, methods and applications.

TL;DR: This review introduces the progress made in ALD, both for computational and experimental methodologies, and provides an outlook of this emerging technology in comparison with other film deposition methods.
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Recent progress in high performance and reliable n-type transition metal oxide-based thin film transistors

TL;DR: In this article, a review of the recent progress in vacuum-based n-type transition metal oxide (TMO) thin film transistors (TFTs) is presented, and the effects of the TMO composition on the performance of the resulting oxide TFTs has been reviewed, and classified into binary, ternary and quaternary composition systems.
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High Electron Mobility Thin‐Film Transistors Based on Solution‐Processed Semiconducting Metal Oxide Heterojunctions and Quasi‐Superlattices

TL;DR: The QSL transistor concept proposed here can in principle extend to a range of other oxide material systems and deposition methods and can be seen as an extremely promising technology for application in next‐generation large area optoelectronics such as ultrahigh definition optical displays and large‐area microelectronics where high performance is a key requirement.
Journal ArticleDOI

Heterojunction oxide thin-film transistors with unprecedented electron mobility grown from solution

TL;DR: It is found that In 2O3/ZnO transistors exhibit band-like electron transport, with mobility values significantly higher than single-layer In2O3 and ZnO devices by a factor of 2 to 100, demonstrating engineering of solution-grown metal oxide heterointerfaces as an alternative strategy to thin-film transistor development and has the potential for widespread technological applications.
Journal ArticleDOI

Soluble oxide gate dielectrics prepared using the self-combustion reaction for high-performance thin-film transistors

TL;DR: In this article, a self-combustion system utilizing two Al precursors as a fuel and an oxidizer is systematically compared with conventional combustive Al-oxide gate dielectrics with urea in terms of combustion efficiency and dielectric properties.
References
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Journal ArticleDOI

Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

TL;DR: A novel semiconducting material is proposed—namely, a transparent amorphous oxide semiconductor from the In-Ga-Zn-O system (a-IGZO)—for the active channel in transparent thin-film transistors (TTFTs), which are fabricated on polyethylene terephthalate sheets and exhibit saturation mobilities and device characteristics are stable during repetitive bending of the TTFT sheet.
Journal ArticleDOI

A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface

TL;DR: A model interface is examined between two insulating perovskite oxides—LaAlO3 and SrTiO3—in which the termination layer at the interface is controlled on an atomic scale, presenting a broad opportunity to tailor low-dimensional charge states by atomically engineered oxide heteroepitaxy.
Journal ArticleDOI

Present status of amorphous In–Ga–Zn–O thin-film transistors

TL;DR: Most device issues, such as uniformity, long-term stability against bias stress and TFT performance, are solved for a-IGZO TFTs.
Journal ArticleDOI

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

TL;DR: In this paper, the effect of water exposure on amorphous indium-gallium-zinc oxide (a-IGZO) semiconductors was investigated and two competing mechanisms depending on the thickness of the active channel were clarified.
Journal ArticleDOI

ZnO-based transparent thin-film transistors

TL;DR: In this article, the authors proposed a transparent ZnO-based thin-film transistors (TFTs) for select-transistors in each pixel of an active-matrix liquid-crystal display.
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