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Exact probabilistic testability measures for multi-output circuits
TLDR
In this paper, an exact analytical method for single-output combinational circuits is extended to deal with multi-output circuits by introducing a dummy gate, the "X-gate", and applying to the resulting graph the analysis based on supergates.Abstract:
The computation of probabilistic testability measures has become increasingly important and some methods have been proposed, although the exact solution of the problem is NP-hard. An exact analytical method for singleoutput combinational circuits is extended to deal with multi-output circuits. Such circuits are reduced to singleoutput ones by introducing a dummy gate, the “X-gate,” and applying to the resulting graph the analysis based on supergates.read more
Citations
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Journal ArticleDOI
Exact probabilistic testability measures for multi-output circuits
TL;DR: An exact analytical method for singleoutput combinational circuits is extended to deal with multi-output circuits by introducing a dummy gate, the "X-gate,” and applying to the resulting graph the analysis based on supergates.
References
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Journal ArticleDOI
Statistical Fault Analysis
TL;DR: Among Stafan's advantages, fault coverage and the undetected fault data obtained for actual circuits are shown to agree within five percent of fault simulator results, yet CPU time and memory demands fall far short of those required in fault simulation.
Journal ArticleDOI
Multiple distributions for biased random test patterns
TL;DR: It is shown that the problem can be solved using several distributions instead of a single one, and an efficient procedure for computing the optimized input probabilities is presented.
Journal ArticleDOI
A new model for computation of probabilistic testability in combinational circuits
TL;DR: Techniques are suggested for limiting computational effert in circuits with very large supergates where approximate computation may be desirable and for exact computation of probabilities in terms of subcircuits covering the original circuit.
An exact analysis for efficient computation of random-pattern testability in combinational circuits
TL;DR: ExperiowaIal ......... ibal ....