Proceedings ArticleDOI
Generation and verification of tests for analogue circuits subject to process parameter deviations
S.J. Spinks,C.D. Chalk,I.M. Bell,Mark Zwolinski +3 more
- pp 100-109
TLDR
A new test effectiveness metric of probability of detection is defined and the application of the technique to an analog multiplier circuit is presented, which results in fault coverage figures more meaningful than those obtained with a fixed threshold.Abstract:
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analogue multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fixed threshold, although they appear lower.read more
Citations
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Extraction and Simulation of Realistic CMOS Faults using
TL;DR: FXT as mentioned in this paper is a software tool which implements inductive fault analysis for CMOS circuits and extracts a comprehensive list of circuit-level faults for any given CMOS circuit and ranks them according to their relative likelihood of occurrence.
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Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing
TL;DR: A new test strategy based on DC or very low frequency (LF) measurements, which allows the elimination of expensive RF tests, is presented and proves to be a very interesting alternative to validate RF parameters with no need of expensiveRF equipments.
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Applying a robust heteroscedastic probabilistic neural network to analog fault detection and classification
TL;DR: This paper describes a new neural network structure that clusters responses assuming different means and variances, and shows that this technique is significantly more accurate than other classification methods.
Proceedings ArticleDOI
Dynamic supply current testing of analog circuits using wavelet transform
Swarup Bhunia,Kaushik Roy +1 more
TL;DR: Simulation results on benchmark circuits show that wavelet based method is on average 25 times more sensitive than DFT (Discrete Fourier Transform) for parametric faults and can be considered as a promising alternative for analog fault detection amidst measurement hardware noise and process variation.
Proceedings ArticleDOI
CAT platform for analogue and mixed-signal test evaluation and optimization
TL;DR: The CAT platform as mentioned in this paper provides tools for fault simulation, test generation and test optimization for analogue and mixed-signal circuits, including tools for simulation independent fault modeling and injection, which makes this approach flexible with respect to past approaches.
References
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Book
Practical Nonparametric Statistics
TL;DR: Probability Theory. Statistical Inference. Contingency Tables. Appendix Tables. Answers to Odd-Numbered Exercises and Answers to Answers to Answer Questions as discussed by the authors.
Proceedings ArticleDOI
Extraction and simulation of realistic CMOS faults using inductive fault analysis
F.J. Ferguson,John Paul Shen +1 more
TL;DR: FXT is a software tool which implements inductive fault analysis for CMOS circuits and extracts a comprehensive list of circuit-level faults for any given CMOS circuit and ranks them according to their relative likelihood of occurrence.
Proceedings Article
Extraction and Simulation of Realistic CMOS Faults using
TL;DR: FXT as mentioned in this paper is a software tool which implements inductive fault analysis for CMOS circuits and extracts a comprehensive list of circuit-level faults for any given CMOS circuit and ranks them according to their relative likelihood of occurrence.
Journal ArticleDOI
Analog circuit fault diagnosis based on sensitivity computation and functional testing
M. Slamani,Bozena Kaminska +1 more
TL;DR: An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented and Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.
Journal ArticleDOI
Optimization-Based Multifrequency Test Generation for Analog Circuits
TL;DR: This paper proposes an optimization based multifrequency test generation method for detecting parametric faults in linear analog circuits and selects the test frequencies that maximize the observability on a circuit performance of a parameter deviation under the worst masking effects of normal variations of the other parameters.