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Journal ArticleDOI

Lateral current transport path, a model for GaN-based light-emitting diodes: Applications to practical device designs

Hyun-Chul Kim, +3 more
- 05 Aug 2002 - 
- Vol. 81, Iss: 7, pp 1326-1328
TLDR
In this paper, an advanced model to explain the current spreading phenomenon of a conventional GaN-based light-emitting diode is presented, and an equivalent circuit consisting of the two lateral resistance components of the p-transparent electrode and the n-type layer is proposed.
Abstract
An advanced model to explain the current spreading phenomenon of a conventional GaN-based light-emitting diode is presented. For this work, an equivalent circuit, consisting of the two lateral resistance components of the p-transparent electrode and the n-type layer is proposed. Theoretical calculations clearly reveal that the current density crowds near the n or p pads according to the device parameters and has an exponential behavior as a function of the lateral length. Based on these results, appropriate device parameters including the critical transparent-electrode thickness were determined, leading to a perfectly uniform current distribution. It was even possible to demonstrate the ideal device geometry without the need for a transparent electrode such as an interdigitated structure.

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Citations
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Monolithic Micro Light-Emitting Diode/Metal Oxide Nanowire Gas Sensor with Microwatt-Level Power Consumption.

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References
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Book

The Blue Laser Diode: GaN based Light Emitters and Lasers

TL;DR: The physics of gallium nitrides and related compounds GaN growth p-Type GaN obtained by electron beam irradiation n-Type GAN p-type GaN InGaN Zn and Si co-doped GaN double-heterostructure blue and blue green LEDs inGaN single-quantum-well structure LEDs room-temperature pulsed operation of laser diodes emission mechanisms of LEDs and LDs room temperature CW operation of InGAN MQW LDs latest results as discussed by the authors.
Journal ArticleDOI

Current crowding in GaN/InGaN light emitting diodes on insulating substrates

TL;DR: In this paper, the p-side-up mesa structure GaN/InGaN LEDs with high contact resistance and p-type confinement layer resistivity have a relatively uniform current distribution.
Journal ArticleDOI

Current crowding and optical saturation effects in GaInN/GaN light-emitting diodes grown on insulating substrates

TL;DR: In this paper, current crowding in mesa-structure GaInN/GaN light emitting diodes (LEDs) grown on insulating substrates is analyzed.
Journal ArticleDOI

Modeling of a GaN-based light-emitting diode for uniform current spreading

TL;DR: In this paper, the effect of current density on the reliability characteristics of the GaN/InGaN multiquantum-well light-emitting diode (LED) has been examined from the view point of uniform current spreading.
Journal ArticleDOI

The effect of distributed series resistance on the dark and illuminated current—Voltage characteristics of solar cells

TL;DR: In this paper, the authors analyzed series resistance effects in solar cells and the correctness of representing these by a lumped parameter is discussed for any conditions of bias and illumination, where r e and r b are the emitter layer and base region resistances, respectively.