Journal ArticleDOI
Macromodeling of integrated circuit operational amplifiers
TLDR
A macromodel has been developed for integrated circuit (IC) op amps which provides an excellent pin-for-pin representation and provides simulated circuit responses that have run times which are an order of magnitude faster and less costly in comparison to modeling the op amp at the electronic device level.Abstract:
A macromodel has been developed for integrated circuit (IC) op amps which provides an excellent pin-for-pin representation. The model elements are those which are common to most circuit simulators. The macromodel is a factor of more than six times less complex than the original circuit, and provides simulated circuit responses that have run times which are an order of magnitude faster and less costly in comparison to modeling the op amp at the electronic device level. Expressions for the values of the elements of the macromodel are developed starting from values of typical response characteristics of the op amp. Examples are given for three representative op amps. In addition, the performance of the macromodel in linear and nonlinear systems is presented. For comparison, the simulated circuit performance when modeling at the device level is also demonstrated.read more
Citations
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Proceedings ArticleDOI
Remembrance of circuits past: macromodeling by data mining in large analog design spaces
TL;DR: Experimental results show that this work can automatically build useful nonlinear regression models for large analog design spaces, parameterized by variables manipulated by synthesis, trained by the data points visited during synthesis.
Proceedings ArticleDOI
Fault modeling for the testing of mixed integrated circuits
A. Meixner,Wojciech Maly +1 more
TL;DR: A fault- modeling methodology which could be applied to capture the malfunctioning of analog components in mixed IC's is introduced and a list of problems to be solved in the subsequent research dealing with testing of mixcd analog/digital integrated circuits.
Proceedings ArticleDOI
Behavioral modeling of analog blocks using the Saber simulator
TL;DR: The use of behavioral modeling for complex analog components is described and the four levels of modeling complexity that are useful for the different designer needs during the design project is explained.
Journal ArticleDOI
Computer-Aided Analysis of RFI Effects in Operational Amplifiers
TL;DR: In this article, the modified Ebers-Moll model is used to predict RFI effects in the 741 operational amplifier (op amp)-a bipolar linear integrated circuit (IC), and RFI susceptibility predictions for RF incident upon the op-amp input terminals are made using a complete model, a macromodel, and a voltage-offset model.
Journal ArticleDOI
Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review
TL;DR: In this paper, failure failures induced on analog integrated circuits by electromagnetic interference (EMI) were analyzed with particular emphasis on integrated operational amplifiers built with different technologies. And the correlation found between EMI susceptibility and large-signal opamp behavior was discussed.
References
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Journal ArticleDOI
The monolithic op amp: a tutorial study
TL;DR: In this paper, a study of the IC op amp is presented to explain details of its behavior in a simplified and understandable manner, including thermal feedback effects on gain, basic relationships for bandwidth and slew rate, and a discussion of pole-splitting frequency compensation.
Journal ArticleDOI
Recent advances in monolithic operational amplifier design
Paul R. Gray,Robert G. Meyer +1 more
TL;DR: The state of the art in monolithic operational amplifier design is surveyed in this paper, where a set of large and small-signal performance parameters are defined and discussed, and relationships between the important operational amplifier parameters of slew rate, offset voltage, and unity gain bandwidth are demonstrated.
Journal ArticleDOI
A computer-aided evaluation of the 741 amplifier
Bruce A. Wooley,D.O. Pederson +1 more
TL;DR: An investigation of a typical example of the 741-type IC amplifier of the characteristics of the transistors and the performance limitations resulting from the devices and the individual stages of the amplifier.
Journal ArticleDOI
Terminal Modeling and Photocompensation of Complex Microcircuits
D. N. Pocock,M. G. Krebs +1 more
TL;DR: Results are presented on generalized approaches to derive radiation-inclusive simplified models of linear and digital microcircuits, and the linear modeling technique suggests that photocompensation networks can be applied successfully at the terminals of the device.
Proceedings ArticleDOI
Macromodeling of operational amplifiers
TL;DR: A macromodel developed for use in IC simulators, which is capable of accurately modeling operational amplifier linear and nonlinear behavior, while reducing simulation costs by an order of magnitude, will be described.