Journal ArticleDOI
MIS capacitance and derivative of capacitance, with application to nonparabolic band semiconductors☆
TLDR
Theoretical capacitance and derivative of capacitance curves for an MIS structure with a semiconductor having a nonparabolic conduction band and a parabolic valence band are calculated for single level trap, uniform and nonuniform surface state distributions in this paper.Abstract:
Theoretical capacitance ( C - V ) and derivative of capacitance ( C ′- V ) curves for an MIS structure with a semiconductor having a nonparabolic conduction band and a parabolic valence band are calculated for single level trap, uniform and nonuniform surface state distributions. The Kane model is used to describe the nonparabolic conduction band. The effects of varying the hole effective mass, Kane matrix element, temperature, surface state densities (both donor and acceptor types), and the degeneracy factors for the surface states is examined. The computed results are based on Hg 0·8 Cd 0·2 TeZnS device parameters.read more
Citations
More filters
Book ChapterDOI
The properties and applications of the Hg 1−x Cd x Te alloy system
Ralf Dornhaus,Günter Nimtz +1 more
Journal ArticleDOI
Bulk levels and interface calculations for narrow band-gap semiconductors
Ilan Bloom,Yael Nemirovsky +1 more
TL;DR: In this paper, the characteristics of metal-insulator-semiconductor (MIS) devices in narrow band-gap semiconductors are presented, including the non-parabolicity of the conduction band, degeneracy in the occupancy of the free carriers and compensated and partially ionized impurities or defects.
Journal ArticleDOI
Graphical method for determining the flat band voltage for silicon on sapphire
TL;DR: In this paper, a method based on the graphical solution of equations for the standard high frequency C - V curve and its first derivative yields the flat-band voltage directly, since only the accumulation section of the C- V curve is employed, errors due to the surface states are small.
Journal ArticleDOI
Automated measurement and analysis of MIS interfaces in narrow-bandgap semiconductors
TL;DR: In this paper, a computerized system for simultaneous measurement of high-frequency and quasi-static MIS capacitance is described, and the importance of this simultaneity in the application of various analysis methods to MIS devices in narrow-bandgap semiconductors is discussed.
Journal ArticleDOI
Effects of Gamma Irradiation on Surface Properties and Detector Properties of Hg1-xCdxTe Photoconductors
TL;DR: In this paper, the surface states influence minority carrier trapping at low optical backgrounds in HgCdTe detectors, and the authors conclude that surface states themselves are not responsible for trapping; however, a depleted surface appears to be necessary for trapping.
References
More filters
Journal ArticleDOI
Physical Theory of Semiconductor Surfaces
Journal ArticleDOI
Calculation of the Space Charge, Electric Field, and Free Carrier Concentration at the Surface of a Semiconductor
TL;DR: In this article, a solution of Poisson's equation utilizing Boltzmann statistics, the space charge, electric field, and change in free carrier concentration have been calculated for a semiconductor surface.
Journal ArticleDOI
Space Charge Calculations for Semiconductors
Ruth Seiwatz,Mino Green +1 more
TL;DR: In this article, the electric field at the surface of a semiconductor is obtained as a function of the semiconductor bulk properties and the potential difference across the space charge region, and conditions under which the equation for the field can be conveniently simplified are discussed, and a particular case is treated numerically.
Journal ArticleDOI
Temperature and Alloy Compositional Dependences of the Energy Gap of Hg1−xCdxTe
Joseph L. Schmit,E. L. Stelzer +1 more
TL;DR: In this paper, the temperature and compositional dependences of the energy gap were determined for the alloy semiconductor mercury-cadmium telluride (Hg1−xCdxTe), where the cutoff wavelength was measured on photoconductive and photovoltaic infrared detectors where 0.17