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Journal ArticleDOI

Phase-stepping interferometry: Five-frame algorithm with an arbitrary step

G. Stoilov, +1 more
- 01 Sep 1997 - 
- Vol. 28, Iss: 1, pp 61-69
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TLDR
In this article, a new formula for calculating the phase in interferometric measurements by the phase-stepping method was proposed, which utilizes equal phase steps with an arbitrary value.
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This article is published in Optics and Lasers in Engineering.The article was published on 1997-09-01. It has received 114 citations till now. The article focuses on the topics: Phase (waves).

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Citations
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Journal ArticleDOI

Phase-evaluation methods in whole-field optical measurement techniques

TL;DR: The phase-evaluation methods as discussed by the authors use a combination of phase-shifted intensity values, provided by the modulation of one or several fringe patterns, to calculate the principal value of the optical phase.
Journal ArticleDOI

Phase-shift extraction and wave-front reconstruction in phase-shifting interferometry with arbitrary phase steps.

TL;DR: A new approach to reconstructing the object wave front in phase-shifting interferometry with arbitrary unknown phase steps is proposed, capable of retrieving the original object field, including its amplitude and phase distributions simultaneously, with arbitrary and unequal phase steps in a three- or four-frame method.
Journal ArticleDOI

Generalized phase-shifting interferometry with arbitrary unknown phase steps for diffraction objects.

TL;DR: A general method of extracting the arbitrary unknown and unequal phase steps in phase-shift interferometry from interferograms recorded on the diffraction field of an object and then reconstructing the object wave front digitally with the authors' derived formulas is proposed.
Journal ArticleDOI

Application of cooled spatial light modulator for high power nanosecond laser micromachining

TL;DR: The application of a commercially available spatial light modulator (SLM) to control the spatial intensity distribution of a nanosecond pulsed laser for micromachining is described for the first time.
Journal ArticleDOI

Quantitative refractive index distribution of single cell by combining phase-shifting interferometry and AFM imaging.

TL;DR: Results were consistent with Raman spectral analysis, indicating that the proposed PSI/AFM based refractive index system is likely to become a useful tool for intracellular biochemical components analysis measurement, and this will facilitate its application for revealing cell structure and pathological state from a new perspective.
References
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Book ChapterDOI

V Phase-Measurement Interferometry Techniques

TL;DR: The phase modulation in an interferometer can be induced by moving a mirror, tilting a glass plate, moving a grating, rotating a half-wave plate or analyzer, using an acoustooptic or electro-optic modulator, or using a Zeeman laser as mentioned in this paper.
Journal ArticleDOI

Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm.

TL;DR: La difference de phase entre les 2 faisceaux interferant varie de maniere connue et on fait des mesures de the distribution d'intensite a travers la pupille correspondant a au moins 3 dephasages differents.
Journal ArticleDOI

Digital wave-front measuring interferometry: some systematic error sources.

TL;DR: To study the occurrence of wave-front irregularities caused by dust particles a model has been developed and countermeasures derived which assure sufficient regularity of contour line plots, and the repeatability of the present experimental setup was better than λ/200 within the 3σ limits.
Journal ArticleDOI

Generalized Data Reduction For Heterodyne Interferometry

TL;DR: A generalized algorithm for use with digital heterodyne or fringe- scanning interferometers was developed that removes many of the restrictions that had previously applied to the data collection scheme.
Journal ArticleDOI

Automatic fringe pattern analysis: A review

TL;DR: A cross-section of techniques and applications of automatic and interactive fringe pattern analysis and some of the ways in which prior knowledge of the fringe pattern characteristics can be used to simplify the analysis procedure are described.
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