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Physics of thin films : advances in research and development
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This article is published in Physics Today.The article was published on 1968-04-01. It has received 128 citations till now.read more
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Exchange-biased magnetic tunnel junctions and application to nonvolatile magnetic random access memory (invited)
Stuart S. P. Parkin,Kevin P. Roche,Mahesh G. Samant,P. M. Rice,Robert Beyers,Roy Edwin Scheuerlein,Eugene J. O'Sullivan,Stephen L. Brown,J. Bucchigano,D. W. Abraham,Yu Lu,M. Rooks,Philip L. Trouilloud,R. A. Wanner,William J. Gallagher +14 more
TL;DR: In this paper, exchange biased magnetic tunnel junction (MTJ) structures are shown to have useful properties for forming magnetic memory storage elements in a novel cross-point architecture, which exhibit very large magnetoresistive (MR) values exceeding 40% at room temperature, with specific resistance values ranging down to as little as ∼60 Ω(μm)2.
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Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering
TL;DR: A review of the GISAXS technique, from experimental issues to the theories underlying the data analysis, with a wealth of examples, can be found in this paper, where the authors introduce the notions of particle form factor and interference function, together with the different cases encountered according to the size/shape dispersion.
Journal ArticleDOI
Radiative decay engineering 4. Experimental studies of surface plasmon-coupled directional emission.
TL;DR: Directional SPCE was observed whether the fluorophore was excited directly or by the evanescent field due to the surface plasmon resonance, and shows intrinsic spectral resolution because the coupling angles depend on wavelength.
Journal ArticleDOI
Sol-gel silica/titania-on-silicon Er/Yb-doped waveguides for optical amplification at 1.5 μm
TL;DR: By combining the sol-gel method and the spin-coating technique, silica-on-silicon Er-doped glass optical planar waveguides were fabricated as discussed by the authors.
Journal ArticleDOI
Determination of roughness correlations in multilayer films for x‐ray mirrors
Donald E. Savage,J. Kleiner,N. Schimke,Y. H. Phang,T. Jankowski,J. R. Jacobs,R. Kariotis,Max G. Lagally +7 more
TL;DR: In this paper, the lateral correlation length along the interfaces can additionally be determined, and correlated roughness contributes significantly to the total roughness, even at length scales that are surprisingly short, of the order 2-6 nm.