Preparation of Al-Cu-Fe thin films by vapor deposition technique from a single source

doi:10.1016/S0025-5408(01)00773-5

Journal ArticleDOI

Preparation of Al-Cu-Fe thin films by vapor deposition technique from a single source

Aloke Kanjilal, +2 more

- 01 Feb 2002 -

Materials Research Bulletin

- Vol. 37, Iss: 2, pp 343-351

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TLDR

In this paper, the formation of stable icosahedral Al-Cu-Fe quasicrystalline thin films by thermal vapor deposition techniques (indirect heating and e-beam heating) from a single source was reported.

About:

This article is published in Materials Research Bulletin.The article was published on 2002-02-01. It has received 17 citations till now. The article focuses on the topics: Thin film & Deposition (phase transition).

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The Materials Science of Thin Films

Milton Ohring

TL;DR: A review of materials science can be found in this paper, where the authors describe the properties of thin-film materials and their applications in the following categories: electrical and magnetic properties, optical properties, and material properties.

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Journal ArticleDOI

Structure of rapidly quenched Al-Mn.

Peter A. Bancel, +4 more

- 03 Jun 1985 -

Physical Review Letters

TL;DR: In this paper, the electron-diffraction pattern shows icosahedral symmetry and peaks in the x-ray diffraction pattern can be indexed to a mixture of fcc Al and a phase whose reciprocal lattice is described by a sum of icoshedral vectors.

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Journal ArticleDOI

Amorphous-to-quasicrystalline transformation in the solid state.

D. A. Lilienfeld, +4 more

- 07 Oct 1985 -

Physical Review Letters

TL;DR: La phase amorphe se transforme en etat quasi-cristallin par deux chemins: thermique et thermique assiste par faisceau d'ions a temperature ambiante.

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Journal ArticleDOI

Icosahedral-phase formation by solid-state interdiffusion.

D.M. Follstaedt, +1 more

- 28 Apr 1986 -

Physical Review Letters

TL;DR: It is demonstrated that the icosahedral phase nucleates in the solid state in preference to crystalline phases of lower free energy, even though the initial material does not have liquidlike icosahed short-range order.

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Journal ArticleDOI

Formation of AlCuFe quasicrystalline thin films by solid state diffusion

Thierry Klein, +1 more

- 24 Jan 1994 -

Applied Physics Letters

TL;DR: In this article, the authors show that thin films 3000 A in thickness of the icosahedral AlCuFe phase can be formed by solid state diffusion of sputtered Al, Cu, and Fe layers.

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