Journal ArticleDOI
Quantitative determination of contact stiffness using atomic force acoustic microscopy
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TLDR
A technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively, with a resolution of approximately 20 nm, exploiting the contact resonance frequencies of standard cantilevers used in atomic force microscopy.About:
This article is published in Ultrasonics.The article was published on 2000-03-01. It has received 289 citations till now. The article focuses on the topics: Atomic force acoustic microscopy & Non-contact atomic force microscopy.read more
Citations
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AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging
Alexandre Dazzi,Craig Prater +1 more
TL;DR: AFM-IR applications that will be discussed include those in polymers, life sciences, photonics, solar cells, semiconductors, pharmaceuticals, and cultural heritage.
Journal ArticleDOI
Combinatorial approaches as effective tools in the study of phase diagrams and composition-structure-property relationships
TL;DR: A comprehensive overview of state-of-the-art combinatorial/high-throughput methodologies and tools for accelerated materials research and discovery can be found in this article.
Journal ArticleDOI
Atomic force acoustic microscopy methods to determine thin-film elastic properties
TL;DR: In this article, an atomic force acoustic microscopy (AFAM) method was used to determine the elastic properties of thin thin films by measuring the frequencies of an AFM cantilever's first two flexural resonances while in contact with a material.
Journal ArticleDOI
Mapping nanoscale elasticity and dissipation using dual frequency contact resonance AFM.
TL;DR: A technique that simultaneously quantifies the contact stiffness and dissipation of an AFM cantilever in contact with a surface, which can ultimately be used for quantitative nanomechanical characterization of surfaces is reported on.
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Contact-resonance atomic force microscopy for viscoelasticity
TL;DR: In this paper, the authors present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the cantilever when its tip is in contact with a sample surface.
References
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Journal ArticleDOI
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
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Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment
Ute Rabe,K. Janser,Walter Arnold +2 more
TL;DR: In this article, the free vibration spectra and the local vibration amplitude of four rectangular atomic force microscope cantilevers made of silicon have been examined experimentally in a spectral range of 100 kHz to 10 MHz.
Journal ArticleDOI
Using force modulation to image surface elasticities with the atomic force microscope
P. Maivald,Hans-Jürgen Butt,Scot A. C. Gould,Craig Prater,Barney Drake,J. Gurley,V. Elings,Paul K. Hansma +7 more
TL;DR: In this paper, a new contrast mechanism relies on variation in the surface elasticity of a carbon fiber and epoxy composite is used to reveal contrast between the two materials, and a lateral modulation mode is employed to highlight atomic steps in gold.
Journal ArticleDOI
Ultrasonic force microscopy for nanometer resolution subsurface imaging
TL;DR: In this paper, a sample of atomic force microscope (AFM) is vertically vibrated at ultrasonic frequencies much higher than the cantilever resonance, the tip cannot vibrate but it is cyclically indented into the sample.
Journal ArticleDOI
Nanoscale reconstruction of surface crystallography from three-dimensional polarization distribution in ferroelectric barium-titanate ceramics
TL;DR: In this article, the three-dimensional orientation of polarization vectors at the surface of ferroelectric barium-titanate (BaTiO3) ceramics is evaluated using voltage-modulated scanning force microscopy (SFM).
Related Papers (5)
Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment
Ute Rabe,K. Janser,Walter Arnold +2 more