J
Jean Massies
Researcher at Centre national de la recherche scientifique
Publications - 459
Citations - 11447
Jean Massies is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Molecular beam epitaxy & Photoluminescence. The author has an hindex of 53, co-authored 458 publications receiving 11005 citations. Previous affiliations of Jean Massies include Alcatel-Lucent.
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Journal ArticleDOI
Polarized emission from GaN/AlN quantum dots subject to uniaxial thermal interfacial stresses
TL;DR: In this paper, the authors studied the excitation-dependent optical properties of GaN/AlN self-assembled quantum dots (QDs) grown on Si(111) substrates and exploited microcracks that form during the postgrowth cooling as stressors in order to create localized regions of uniaxial stress over limited regions of the samples.
Journal ArticleDOI
Variation of the wave-function localization on the monolayer scale in GaSb quantum wells probed by magnetoluminescence
TL;DR: The high sensitivity of the magnetoluminescence to the modifications of the wave function, even on the scale of a single monolayer, has been used to deduce experimentally the dependence of the effective reduced mass on the well width.
Proceedings ArticleDOI
MBE growth of high quality AlGaN/GaN HEMTs on resistive Si[111] substrate with RF small signal and power performances
Yvon Cordier,Fabrice Semond,P. Lorenzini,Nicolas Grandjean,Franck Natali,Benjamin Damilano,Jean Massies,Virginie Hoel,A. Minko,Nicolas Vellas,Christophe Gaquiere,J.C. Dejaeger,B. Dessertene,S. Cassette,M. Surrugue,D. Adam,J. C. Grattepain,Sylvain Delage +17 more
TL;DR: In this paper, the structural quality of the epilayers as well as electrical properties have been investigated in a reactive molecular beam epitaxy system using ammonia (Riber Compact 21).
Journal ArticleDOI
Structural characterisation of Sb-based heterostructures by X-ray scattering methods
TL;DR: In this paper, specular and non-specular X-ray reflectometry experiments have been performed on two MBE-samples elaborated with different shutter sequences at the interfaces, and the results have revealed the presence of a highly disturbed thin-layer on top of the MOVPE-made GaInAs, whose presence has been explained by Inconcentration modification during the desoxidation procedure at the surface of the InAs.
Journal ArticleDOI
RBS studies of AlGaN/AlN Bragg reflectors
Lionel Hirsch,Franck Natali,P. Moretto,Albert-Serge Barriere,D. Byrne,Fabrice Semond,Jean Massies,Nicolas Grandjean,N. Antoine-Vincent,Joël Leymarie +9 more
TL;DR: In this article, the RBS phenomenon is described and experimental results concerning Bragg reflectors and microcavities grown on silicon substrates by molecular beam epitaxy are presented.