We present a comprehensive, up-to-date compilation of band parameters for the technologically important III–V zinc blende and wurtzite compound semiconductors: GaAs, GaSb, GaP, GaN, AlAs, AlSb, AlP, AlN, InAs, InSb, InP, and InN, along with their ternary and quaternary alloys. Based on a review of the existing literature, complete and consistent parameter sets are given for all materials. Emphasizing the quantities required for band structure calculations, we tabulate the direct and indirect energy gaps, spin-orbit, and crystal-field splittings, alloy bowing parameters, effective masses for electrons, heavy, light, and split-off holes, Luttinger parameters, interband momentum matrix elements, and deformation potentials, including temperature and alloy-composition dependences where available. Heterostructure band offsets are also given, on an absolute scale that allows any material to be aligned relative to any other.

Band parameters for III–V compound semiconductors and their alloys

We present a comprehensive and up-to-date compilation of band parameters for all of the nitrogen-containing III–V semiconductors that have been investigated to date. The two main classes are: (1) “conventional” nitrides (wurtzite and zinc-blende GaN, InN, and AlN, along with their alloys) and (2) “dilute” nitrides (zinc-blende ternaries and quaternaries in which a relatively small fraction of N is added to a host III–V material, e.g., GaAsN and GaInAsN). As in our more general review of III–V semiconductor band parameters [I. Vurgaftman et al., J. Appl. Phys. 89, 5815 (2001)], complete and consistent parameter sets are recommended on the basis of a thorough and critical review of the existing literature. We tabulate the direct and indirect energy gaps, spin-orbit and crystal-field splittings, alloy bowing parameters, electron and hole effective masses, deformation potentials, elastic constants, piezoelectric and spontaneous polarization coefficients, as well as heterostructure band offsets. Temperature an...

Band parameters for nitrogen-containing semiconductors

Gallium nitride (GaN) and its allied binaries InN and AIN as well as their ternary compounds have gained an unprecedented attention due to their wide-ranging applications encompassing green, blue, violet, and ultraviolet (UV) emitters and detectors (in photon ranges inaccessible by other semiconductors) and high-power amplifiers. However, even the best of the three binaries, GaN, contains many structural and point defects caused to a large extent by lattice and stacking mismatch with substrates. These defects notably affect the electrical and optical properties of the host material and can seriously degrade the performance and reliability of devices made based on these nitride semiconductors. Even though GaN broke the long-standing paradigm that high density of dislocations precludes acceptable device performance, point defects have taken the center stage as they exacerbate efforts to increase the efficiency of emitters, increase laser operation lifetime, and lead to anomalies in electronic devices. The p...

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Luminescence properties of defects in GaN

Recent research results pertaining to InN, GaN and AlN are reviewed, focusing on the different growth techniques of Group III-nitride crystals and epitaxial films, heterostructures and devices. The chemical and thermal stability of epitaxial nitride films is discussed in relation to the problems of deposition processes and the advantages for applications in high-power and high-temperature devices. The development of growth methods like metalorganic chemical vapour deposition and plasma-induced molecular beam epitaxy has resulted in remarkable improvements in the structural, optical and electrical properties. New developments in precursor chemistry, plasma-based nitrogen sources, substrates, the growth of nucleation layers and selective growth are covered. Deposition conditions and methods used to grow alloys for optical bandgap and lattice engineering are introduced. The review is concluded with a description of recent Group III-nitride semiconductor devices such as bright blue and white light-emitting diodes, the first blue-emitting laser, high-power transistors, and a discussion of further applications in surface acoustic wave devices and sensors.

https://iopscience.iop.org/article/10.1088/0022-3727/31/20/001/pdf

Growth and applications of Group III-nitrides

The optical properties of wurtzite-structured InN grown on sapphire substrates by molecular-beam epitaxy have been characterized by optical absorption, photoluminescence, and photomodulated reflectance techniques. These three characterization techniques show an energy gap for InN between 0.7 and 0.8 eV, much lower than the commonly accepted value of 1.9 eV. The photoluminescence peak energy is found to be sensitive to the free-electron concentration of the sample. The peak energy exhibits very weak hydrostatic pressure dependence, and a small, anomalous blueshift with increasing temperature.

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Unusual properties of the fundamental band gap of InN

We have investigated the thermal stability of GaN using Raman scattering. Noninvasive optical monitoring of structural damage to GaN by high-temperature anneals in nitrogen ambient has been demonstrated. Characteristic features in the Raman spectrum identify three thermal stability regimes. Thermal damage between 900 and 1000 °C results in the appearance of a broad Raman peak between the E2 and A1(LO) phonon. For anneals at temperatures higher than 1000 °C emerging macroscopic disorder gives rise to distinct Raman modes at 630, 656, and 770 cm−1. Below 900 °C no thermal damage has been observed. The evolution of the Raman spectrum of GaN with increasing annealing temperature is discussed in terms of disorder-induced Raman scattering. We find clear indications for a reaction at the GaN/sapphire interface for anneals higher than 1000 °C.

Thermal stability of GaN investigated by Raman scattering

InGaN/GaN quantum wells (QWs) were grown by molecular-beam epitaxy on c-plane sapphire substrates. The growth of InGaN is carried out at 550 °C with a large V/III ratio to counteract the low efficiency of NH3 at that temperature and to promote the two-dimensional mode of growth. An In composition of 16%±2% was determined by high-resolution x-ray diffraction experiments. Room-temperature photoluminescence of InGaN/GaN single QWs can be obtained over the whole visible spectrum (from 0.4 to 0.66 μm) by varying the well thickness from 1 to 5 nm. These heterostructures exhibit very large Stokes shifts between the emission and the absorption edge energies.

InGaN/GaN quantum wells grown by molecular-beam epitaxy emitting from blue to red at 300 K

We report on the epitaxial growth of high quality GaN films on Si(111) substrates by molecular beam epitaxy using ammonia. The surface morphology and crystallinity of thick undoped GaN films are characterized by reflection high-energy electron diffraction (RHEED), scanning electron microscopy, and x-ray diffraction. Films having compact morphologies and flat surfaces are obtained and RHEED intensity oscillations are demonstrated for GaN and (Al, Ga)N alloys indicating two-dimensional growth. This has been applied to the growth of AlGaN/GaN quantum well (QW) structures. Low-temperature photoluminescence (PL) spectra of GaN are dominated by a strong and narrow (full width at half maximum=5 meV) band edge luminescence intensity at 3.471 eV assigned to donor bound exciton recombination. PL properties of AlGaN/GaN QW are also very similar to those obtained on equivalent structures grown on sapphire.

GaN grown on Si(111) substrate: From two-dimensional growth to quantum well assessment

Polarity inversion of GaN(0001) by a high Mg doping

We present an experimental and theoretical study of the size dependence of the coupling between electron–hole pairs and longitudinal-optical phonons in Ga1−xInxN/GaN-based quantum wells and quantum boxes. We found that the Huang–Rhys factor S, which determines the distribution of luminescence intensities between the phonon replicas and the zero-phonon peak, increases significantly when the vertical size of the boxes or the thickness of quantum well increases. We assign this variation to (1) the strong electric field present along the growth axis of the system, due to spontaneous and piezoelectric polarizations in these wurtzite materials, and (2) the localization on separate sites of electrons and holes in the plane of the wells or boxes, due to potential fluctuations in the ternary alloy. Indeed, envelope-function calculations for free or localized excitons, with electron–hole distance only controlled by Coulomb interaction, do not account quantitatively for the measured behavior of the S factor. In fact...

Jean Massies

Papers

Thermal stability of GaN investigated by Raman scattering

InGaN/GaN quantum wells grown by molecular-beam epitaxy emitting from blue to red at 300 K

GaN grown on Si(111) substrate: From two-dimensional growth to quantum well assessment

Polarity inversion of GaN(0001) by a high Mg doping

Large size dependence of exciton-longitudinal-optical-phonon coupling in nitride-based quantum wells and quantum boxes