J
Jhi-cheng Lu
Publications - 1
Citations - 22
Jhi-cheng Lu is an academic researcher. The author has contributed to research in topics: Leakage (electronics) & MOSFET. The author has an hindex of 1, co-authored 1 publications receiving 22 citations.
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A 65nm node strained SOI technology with slim spacer
Fu-Liang Yang,Chien-Chao Huang,Hou-Yu Chen,Jhon-Jhy Liaw,Tang-Xuan Chung,Hung-Wei Chen,Chang-Yun Chang,Cheng Chuan Huang,Kuang-Hsin Chen,Di-Hong Lee,Hsun-Chih Tsao,Cheng-Kuo Wen,Shui-Ming Cheng,Yi-Ming Sheu,Ke-Wei Su,Chi-Chun Chen,Tze-Liang Lee,Shih-Chang Chen,C.H. Chen,Cheng-hung Chang,Jhi-cheng Lu,W. Chang,Chuan-Ping Hou,Ying-Ho Chen,Kuei-Shun Chen,Ming Lu,Li-Wei Kung,Yu-Jun Chou,Fu-Jye Liang,Jan-Wen You,King-Chang Shu,Bin-Chang Chang,Jaw-Jung Shin,Chun-Kuang Chen,Tsai-Sheng Gau,Bor-Wen Chan,Yi-Chun Huang,Han-Jan Tao,J.H. Chen,Yung-Shun Chen,Yee-Chia Yeo,Samuel Fung,Carlos H. Diaz,Chii-Ming Wu,Burn-Jeng Lin,Liang Min-Chang,J.Y.-C. Sun,Chenming Hu +47 more
TL;DR: In this article, a 65 nm node strained SOI technology with high performance is demonstrated, providing drive currents of 1015 and 500 /spl mu/A/A//spl µ/m for N-FETs and P-Fet, respectively, at an off-state leakage of 40 nA/spl μ/m using 1 V operation.