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Mohamed I. Elmasry

Researcher at University of Waterloo

Publications -  337
Citations -  5522

Mohamed I. Elmasry is an academic researcher from University of Waterloo. The author has contributed to research in topics: CMOS & Logic gate. The author has an hindex of 38, co-authored 336 publications receiving 5394 citations.

Papers
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Proceedings ArticleDOI

Modeling techniques for substrate coupling for system-on-a-chip

TL;DR: In this article, a boundary element method based on Green's theorem for modeling using a rapid Green's function is presented, and closed-form formulas for fast extraction of substrate parasitics in low-dense chips are derived.
Proceedings ArticleDOI

A novel loss compensation technique for broadband CMOS distributed amplifiers

TL;DR: This paper presents a novel loss compensation technique, an active negative resistor produced by a capacitively source degenerated configuration, to improve the gain flatness and bandwidth of CMOS distributed amplifiers (DAs).
Journal ArticleDOI

BiCMOS nonthreshold logic for high-speed low-power applications

TL;DR: In this article, a high-speed low-power Bi-CMOS nonthreshold logic (BNTL) circuits are presented for reduced power supply voltage. But their performance is not comparable to or better than that provided by emittercoupled logic (ECL) for lower power dissipation.
Proceedings ArticleDOI

A novel matrix-based lumped-element analysis method for CMOS distributed amplifiers

TL;DR: A matrix-based lumped-element theoretical analysis of CMOS distributed amplifiers that employ the image impedance technique for the input/output terminating networks that indicates an improved voltage gain and a better gain uniformity over the bandwidth of the proposed amplifier design.
Proceedings ArticleDOI

The impact of timing yield improvement under process variation on flip-flops soft error rate

TL;DR: In this article, a comparative analysis of the timing yield improvement impact on flip-flops soft error rate by using the STMicroelectronics 65-nm CMOS technology is presented, and compared for the soft error susceptibility.