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Tae-Young Oh

Researcher at Samsung

Publications -  42
Citations -  416

Tae-Young Oh is an academic researcher from Samsung. The author has contributed to research in topics: Semiconductor memory & Dram. The author has an hindex of 13, co-authored 39 publications receiving 391 citations. Previous affiliations of Tae-Young Oh include Tsinghua University.

Papers
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Journal ArticleDOI

A 3.2 Gbps/pin 8 Gbit 1.0 V LPDDR4 SDRAM With Integrated ECC Engine for Sub-1 V DRAM Core Operation

TL;DR: A 1.0 V 8 Gbit LPDDR4 SDRAM with 3.2 Gbps/pin speed and integrated ECC engine for sub-1 V DRAM core is presented and the following IO features are introduced: Low voltage swing terminated logic drivers with VOH level calibration and periodic ZQ calibration, unmatched DQ/DQS scheme and DQS oscillator for D QS tree delay tracking.
Journal ArticleDOI

A 7 Gb/s/pin 1 Gbit GDDR5 SDRAM With 2.5 ns Bank to Bank Active Time and No Bank Group Restriction

TL;DR: To realize the enhanced bank access flexibility, this DRAM employs the following techniques: skewed control logic, PVT variation compensated IO sense amplifier with auto calibration by replica impedance monitor, FIFO based BLSA enable signal generator, low latency VPP generator and active jitter canceller.
Proceedings ArticleDOI

25.1 A 3.2Gb/s/pin 8Gb 1.0V LPDDR4 SDRAM with integrated ECC engine for sub-1V DRAM core operation

TL;DR: The recent revolution in handheld computing with high-speed cellular network made mobile processors have multi-cores and powerful 3D graphic engines that support FHD (1920×1080) or even higher resolutions Consequently, the memory bandwidth requirement has also been increasing, requiring a next-generation mobile DRAM standard.