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Youdou Zheng

Researcher at Nanjing University

Publications -  557
Citations -  7057

Youdou Zheng is an academic researcher from Nanjing University. The author has contributed to research in topics: Chemical vapor deposition & Photoluminescence. The author has an hindex of 31, co-authored 493 publications receiving 5015 citations. Previous affiliations of Youdou Zheng include Xiamen University.

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Synthesis of Polyaniline Nanotubes with a Reactive Template of Manganese Oxide

TL;DR: In this article, Wan and coworkers have synthesized a hollow octahedral structure of PAni using crystal-reductive Cu and showed that the template-removal step can result in the disorder or destruction of the mesostructures oraffect the chemical structure.
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Solar-blind Photodetector with High Avalanche Gains and Bias-tunable Detecting Functionality Based on Metastable Phase α-Ga2O3/ZnO Isotype Heterostructures

TL;DR: Single crystalline α-Ga2O3 epilayers are achieved on nonpolar ZnO (112̅0) substrates for the first time and a high performance Au/α-Ga3/ZnO isotype heterostructure-based Schottky barrier avalanche diode is demonstrated, holding promise for developing high performance solar-blind photodetectors.
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The growth and annealing of single crystalline zno films by low-pressure mocvd

TL;DR: The effect of doping and annealing on the optical and structural properties of single-crystal ZnO films has been investigated by means of X-ray diffraction (XRD), photoluminescence (PL) spectrum and atomic force microscopy (AFM) as mentioned in this paper.
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2D Single‐Crystalline Molecular Semiconductors with Precise Layer Definition Achieved by Floating‐Coffee‐Ring‐Driven Assembly

TL;DR: In this paper, the fabrication of 2D molecular single-crystal semiconductors with precise layer definition by using a floating-coffee-ring-driven assembly is presented, where bilayer molecular films exhibit singlecrystalline features with atomic smoothness and high film uniformity over a large area; field effect transistors yield average and maximum carrier mobilities of 4.8 and 13.0 cm2 V−1 s−1, respectively.
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On the reverse gate leakage current of AlGaN/GaN high electron mobility transistors

TL;DR: In this article, the polarization effect within the AlGaN barrier was incorporated into calculation of the near-surface electrical field ES underneath the Schottky contact metal, which determined the field-dependent characteristics of reverse gate leakage current of high-frequency capacitance-voltage measurement combined with electrostatic analysis is used to estimate ES as a function of reverse bias voltage.