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Open AccessJournal ArticleDOI

A survey on the dynamic characterization of A/D converters

Dominique Dallet, +1 more
- 01 Dec 1998 - 
- Vol. 24, Iss: 4, pp 263-279
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TLDR
The three different methods used to measure the differential non-linearity (DNL) and the integral non- linearity (INL) are explained and a comparison between these three algorithms in simulation and through an experimental case shows that their behaviours differ when the histogram presents edging effects.
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This article is published in Measurement.The article was published on 1998-12-01 and is currently open access. It has received 11 citations till now. The article focuses on the topics: Frequency domain & Time domain.

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Journal ArticleDOI

MN-ADC based on high-reliable 2T2R synapse structure

TL;DR: In this paper , the authors proposed a high-reliable 2T2R synaptic structure, which allows for alternate conversions and online adjustments in a single clock period, which can significantly mitigate the effects of device non-idealities on dynamic performance.
References
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Book

Digital spectral analysis : with applications

S L Marple
TL;DR: This new book provides a broad perspective of spectral estimation techniques and their implementation concerned with spectral estimation of discretespace sequences derived by sampling continuousspace signals.

Digital spectral analysis with applications

TL;DR: In this article, a broad perspective of spectral estimation techniques and their implementation is provided, focusing on spectral estimation of discretespace sequences derived by sampling continuous space signals, including parametric methods, minimum variance method, eigenanalysis-based estimators, multichannel methods, and twodimensional methods.

The instituteof electrical and electronics engineers,inc.

TL;DR: Whenindoubt, sendthe manuscript toE.K.Gannett, Director, Editorial Ser- Advertising Producetion Manager vices, atIEEEHeadquarters, forforwarding tothecorrect party as discussed by the authors.
Journal ArticleDOI

Full-speed testing of A/D converters

TL;DR: Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described.
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