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Journal ArticleDOI

Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals

TLDR
In this article, the electrical properties of a ZnO microwire, a thin film and a hydrothermally grown bulk crystal were compared by means of deep-level transient spectroscopy.
Abstract
Electrical properties of a ZnO microwire grown by carbo-thermal evaporation, a ZnO thin film grown by pulsed-laser deposition and a hydrothermally grown ZnO bulk crystal are compared. Deep defects were investigated by means of deep-level transient spectroscopy. The defect level E3 was observed in all samples investigated. Additionally, a defect labelled T2 that preferentially forms under Zn-rich condition was detected in the microwire, the thin film and the bulk sample. Our results indicate that V Zn is likely involved in this defect.

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Citations
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Journal ArticleDOI

Deep vs shallow nature of oxygen vacancies and consequent n -type carrier concentrations in transparent conducting oxides

TL;DR: In this paper, the formation and ionization energies of oxygen vacancies in three representative transparent conducting oxides (In 2 O 3, SnO 2, and ZnO) were computed using a hybrid quantum mechanical/molecular mechanical embedded cluster approach.
Journal ArticleDOI

Spatially-resolved cathodoluminescence spectroscopy of ZnO defects

TL;DR: Spatially resolved cathodoluminescence spectroscopy has contributed significant new information to our understanding of native point defects in ZnO micro-and nanoscale structures as discussed by the authors.
Book ChapterDOI

Analytical techniques for electrically active defect detection

TL;DR: In this paper, a review of analytical techniques for the detection of electrically active defects in semiconductor materials is presented, where the operation principles, the strengths, and the weaknesses are outlined and illustrated for state-of-the-art examples.
Journal ArticleDOI

Shallow carrier traps in hydrothermal ZnO crystals

TL;DR: In this article, a qualitative model is developed which explains the Y line structural defects, which act as an electron trap with an activation energy of 11 meV, being responsible for the anomalous temperature-dependent cathodoluminescence of H-doped ZnO.
References
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Journal ArticleDOI

Room-temperature ultraviolet nanowire nanolasers

TL;DR: Room-temperature ultraviolet lasing in semiconductor nanowire arrays has been demonstrated and self-organized, <0001> oriented zinc oxide nanowires grown on sapphire substrates were synthesized with a simple vapor transport and condensation process.
Journal ArticleDOI

Growth of nanowire superlattice structures for nanoscale photonics and electronics.

TL;DR: Single-nanowire photoluminescent, electrical transport and electroluminescence measurements show the unique photonic and electronic properties of these nanowire superlattices, and suggest potential applications ranging from nano-barcodes to polarized nanoscale LEDs.
Journal ArticleDOI

Residual Native Shallow Donor in ZnO

TL;DR: In this paper, the authors show that Zn-sublattice defect is the dominant native shallow donor in ZnO and quantitatively explain the high displacement threshold energy.
Journal ArticleDOI

Evidence for native-defect donors in n-type ZnO.

TL;DR: It is shown that, under N ambient, the complex Zn(I)-N(O) is a stronger candidate than H or any other known impurity for a 30 meV donor commonly found in bulk ZnO grown from the vapor phase.
Journal ArticleDOI

Point defects in ZnO: an approach from first principles

TL;DR: Overall defect energetics suggests a preference for the native donor-type defects over acceptor- type defects in ZnO, which is likely to play essential roles in electrical properties.
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