Measurement of band offsets and interface charges by the C–V matching method

TLDR: In this paper, a novel application of capacitance-voltage measurements to determine simultaneously the band discontinuities (ΔEV, ΔEC) and interface charge density (σ) of heterojunctions is described.

Abstract: The present article describes a novel application of capacitance–voltage measurements to determine simultaneously the band discontinuities (ΔEV, ΔEC) and interface charge density (σ) of heterojunctions. The method, which we refer to as C–V matching, complements the most versatile C–V profiling technique proposed by Kroemer and successfully applied by others. In contrast to the C–V profiling which is limited to isotype heterojunctions, the new method is applicable to p-n heterojunctions as well. The methodology is based on three cardinal equations which are not controversial—the lineup of the bands relative to the common Fermi level (at equilibrium) or the quasi-Fermi levels (when voltage is applied), the charge neutrality and the expression for the total capacitance of the heterostructure. The three equations are formulated for equilibrium as well as nonequilibrium conditions, using quasi-Fermi levels and the quasi-equilibrium approximation. The three cardinal equations are defined by the two constant (al...