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Method for manufacturing semiconductor device

TLDR
In this article, a manufacturing method of a semiconductor device for stably obtaining an element structure of a shape/dimension as a design by reducing a difference of etching speeds of respective films, in a process for performing wetting processing on a face to which a plurality of the films are exposed by using buffered hydrofluoric acid.
Abstract
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device for stably obtaining an element structure of a shape/dimension as a design by reducing a difference of etching speeds of respective films, in a process for performing wetting processing on a face to which a plurality of the films are exposed by using a buffered hydrofluoric acid. SOLUTION: In the manufacturing method of the semiconductor device, element separation films 102 are formed on a silicon substrate 101 and silicon sacrifice oxide films 104 are grown in an element forming region. Impurities for forming a well and controlling a threshold of a transistor are implanted through the silicon sacrifice oxide films 104, and the silicon sacrifice oxide films 104 are removed by the buffered hydrofluoric acid. Ammonium fluoride in the buffered hydrofluoric acid is set to be not less than 20 wt. %, and the concentration of a hydrofluoric acid to be not less than 1 wt. %. COPYRIGHT: (C)2004,JPO&NCIPI

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Method for Manufacturing Semiconductor Device

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References
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Method of making a heterojunction bipolar transistor with SIPOS

TL;DR: In this article, a wafer process flow encompasses an arbitray repeated layered structure of heteroepitaxial layers of silicon based films with process control throughout the strata of chemical potential and recombination velocity, suitable for both high performance MOS and bipolar transistors with three dimensional transistor capability.
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TL;DR: In this article, the authors proposed a method for forming a double polysilicon self-aligned bipolar transistor using a single masking step for defining the emitter structure with a narrow emitter-base contact area and a large emitter contact area.
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TL;DR: In this paper, an etching mask comprising an oxide Si film is directly formed on the surface of single crystal or polycrystalline Si film by means of irradiating said surface with oxygen ion beams.
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TL;DR: In this article, the authors present a method to clean the surface of a semiconductor and to protect the surface by a method wherein the following are executed in succession and continuously: a process to remove a carbon-based contamination by applying active oxygen to the surface, a process removing oxygen and an oxide by applying oxygen and hydrogen, and a process forming a surface protective film.