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Journal ArticleDOI

Optical three-dimensional sensing by phase measuring profilometry

TLDR
In this paper, a sinusoidal grating structure is projected onto a diffuse three-dimensional surface, and the resulting deformed grating image is detected by a solid state array camera and processed by a microcomputer using interferometric phase measuring algorithms.
About
This article is published in Optics and Lasers in Engineering.The article was published on 1989-01-01. It has received 183 citations till now. The article focuses on the topics: Grating & Interferometry.

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Citations
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Journal Article

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

TL;DR: In this article, a fast Fourier transform method of topography and interferometry is proposed to discriminate between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour generation techniques.
Journal Article

Digital wavefront measuring interferometer for testing optical surfaces and lenses

TL;DR: In this article, a self-scanned 1024 element photodiode array and a minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100.
Journal ArticleDOI

Dynamic 3-D shape measurement method: A review

TL;DR: The basic principles and typical applications of this technique based on grating projected and fringe analysis, which attracts the attention and research effort in the past ten years, has been targeted as main objective to review.
Journal ArticleDOI

Dual-frequency pattern scheme for high-speed 3-D shape measurement.

TL;DR: A novel dual-frequency pattern is developed which combines a high-frequency sinusoid component with a unit- frequencies component, where the high- frequencies are used to generate robust phase information, and the unit-frequency component is used to reduce phase unwrapping ambiguities.
Journal ArticleDOI

Phase-unwrapping algorithm for the measurement of three-dimensional object shapes.

TL;DR: A new phase-unwrapping algorithm is described that uses two phase images with different precision in the unwrapping; this technique can produce an approximately correct unwrapped in the presence of discontinuities.
References
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Journal Article

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

TL;DR: In this article, a fast Fourier transform method of topography and interferometry is proposed to discriminate between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour generation techniques.
Journal ArticleDOI

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

TL;DR: In this paper, a fast Fourier transform method of topography and interferometry is proposed to discriminate between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour generation techniques.
Journal ArticleDOI

Fourier transform profilometry for the automatic measurement of 3-D object shapes

Mitsuo Takeda, +1 more
- 15 Dec 1983 - 
TL;DR: A new computer-based technique for automatic 3-D shape measurement is proposed and verified by experiments that has a much higher sensitivity than the conventional moire technique and is capable of fully automatic distinction between a depression and an elevation on the object surface.
Journal Article

Digital wavefront measuring interferometer for testing optical surfaces and lenses

TL;DR: In this article, a self-scanned 1024 element photodiode array and a minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100.
Journal ArticleDOI

Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses

TL;DR: The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.
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