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Quantitative characterization of micro-topography a bibliography of industrial surface metrology
R.J. Pike,T.R. Thomas +1 more
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In this article, the authors propose a 3.3-approximation algorithm for the 3.1-GHz bandit-16.3 GHz frequency bandit model, andAbstract:
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Surface roughness measurement by means of speckle wavelength decorrelation
M. Giglio,S. Musazzi,U. Perini +2 more
TL;DR: In this article, the authors exploit speckle wavelength decorrelation techniques for the characterization of surface roughness up to a few microns, using an argon laser, a grating, two photodetectors, and a commercial cross correlator.
Journal ArticleDOI
Digital Terrain Modeling and Industrial Surface Metrology: Converging Realms
TL;DR: In this article, the authors introduce industrial surface metrology, examines the field in the context of terrain modeling a.k.a. surface topography of manufactured components, exemplified by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography.
Journal ArticleDOI
Interdependence of Amplitude Roughness Parameters on Rough Gaussian Surfaces
TL;DR: The numerical analysis of 17 standardized amplitude roughness parameters collected from 90000 computer-generated rough surfaces revealed so far undetected interdependencies among some of these parameters, namely the results show a strong linear relation between 12 amplituderoughness parameters.
Journal ArticleDOI
Digital terrain modelling and industrial surface metrology — converging crafts
TL;DR: This paper introduces terrain modelling and compares it with metrology, noting their differences and similarities and one of the many issues common to both disciplines.
Journal ArticleDOI
Nano-metrology and terrain modelling - convergent practice in surface characterisation
TL;DR: In this paper, the authors introduce terrain modelling, discuss its similarities to and differences from industrial surface metrology, and raise the possibility of a unified discipline of quantitative surface characterisation, and exemplify a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data.
References
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Journal ArticleDOI
Computation of equilibrium surface fluctuations in strained epitaxial films due to interface misfit dislocations
TL;DR: In this paper, a numerical method is developed which leads to an estimate of the magnitude and profile of surface waviness under conditions of thermodynamic equilibrium, and a full transient problem is solved numerically to describe relaxation to a stable equilibrium shape with a constant chemical potential along the surface.
Proceedings ArticleDOI
Supermirror neutron guide coatings
TL;DR: In this paper, the reflectivities of commercially manufactured supermirror guide coatings are reported and the effects of interfacial roughness and interdiffusion on the specular reflectivity examined.
Journal ArticleDOI
Thin film conductivity, impurities and surface roughness
TL;DR: In this paper, a recently developed superposition formalism is used in order to calculate the conductivity σ of thin films that have a rough surface and are filled with scatterers.
Journal ArticleDOI
Evaluation of advanced alumina-based ceramic tool inserts when machining high-tensile steel
X. S. Li,It Meng Low +1 more
TL;DR: In this article, three types of alumina-based ceramic tools (zirconia toughened, titanium carbide reinforced and silicon carbide-whisker reinforced) were used to evaluate their cutting performance when machining a high-tensile steel.
Journal ArticleDOI
Growth simulation of ternary quantum structures and their optical properties
F. Große,R. Zimmermann +1 more
TL;DR: In this article, a simple model is used to simulate the growth process in molecular beam epitaxy and the relation of different growth temperatures to interface structure and optical properties is shown by calculating the exciton lineshape using simulated structures.