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Quantitative characterization of micro-topography a bibliography of industrial surface metrology
R.J. Pike,T.R. Thomas +1 more
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In this article, the authors propose a 3.3-approximation algorithm for the 3.1-GHz bandit-16.3 GHz frequency bandit model, andAbstract:
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Surface roughness measurement by means of speckle wavelength decorrelation
M. Giglio,S. Musazzi,U. Perini +2 more
TL;DR: In this article, the authors exploit speckle wavelength decorrelation techniques for the characterization of surface roughness up to a few microns, using an argon laser, a grating, two photodetectors, and a commercial cross correlator.
Journal ArticleDOI
Digital Terrain Modeling and Industrial Surface Metrology: Converging Realms
TL;DR: In this article, the authors introduce industrial surface metrology, examines the field in the context of terrain modeling a.k.a. surface topography of manufactured components, exemplified by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography.
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Interdependence of Amplitude Roughness Parameters on Rough Gaussian Surfaces
TL;DR: The numerical analysis of 17 standardized amplitude roughness parameters collected from 90000 computer-generated rough surfaces revealed so far undetected interdependencies among some of these parameters, namely the results show a strong linear relation between 12 amplituderoughness parameters.
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Digital terrain modelling and industrial surface metrology — converging crafts
TL;DR: This paper introduces terrain modelling and compares it with metrology, noting their differences and similarities and one of the many issues common to both disciplines.
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Nano-metrology and terrain modelling - convergent practice in surface characterisation
TL;DR: In this paper, the authors introduce terrain modelling, discuss its similarities to and differences from industrial surface metrology, and raise the possibility of a unified discipline of quantitative surface characterisation, and exemplify a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data.
References
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Journal ArticleDOI
Scale-dependent roughening kinetics in vapor deposited gold
Luis Vázquez,Roberto Carlos Salvarezza,Pilar Herrasti,Pilar Ocón,J. M. Vara,Alejandro Jorge Arvia +5 more
TL;DR: In this paper, the roughening kinetics of gold deposits grown from vapor was studied by scanning tunneling microscopy, and the scaling properties of the domain-dependent surface roughness exponents allowed the rationale for experimental data on the fractal behavior of thin metal films.
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Fundamental Differences Between Newtonian and Non-Newtonian Micro-EHL Results
Liming Chang,W. Zhao +1 more
TL;DR: In this paper, the fundamental differences between Newtonian and non-Newtonian micro-EHL results are analyzed analytically in terms of dimensionless parameters of the problem.
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Surface morphology and wetting behavior of poly(α-methylstyrene) thin films prepared by vacuum deposition
TL;DR: In this paper, the effects of substrate type, as well as the molecular weight of the poly(α-methylstyrene) on the morphology and wettability of the deposited films were investigated by measuring the advancing and receding contact angles of water on the surfaces by the method ofWilhelmy plate.
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Description of honed cylinders surface topography
Jacek Michalski,Pawel Pawlus +1 more
TL;DR: A review of the existing methods describing the cylinder bore surface roughness was presented in this article, where the relationship between conventional and proposed roughness parameters was studied using the principal components method as well as correlation and regression analysis.
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Study of electroless nickel plating of ceramic particles
TL;DR: In this article, the authors investigated the deposition of Ni-P onto several ceramic particulate surfaces without the use of the conventional sensitization and activation steps, which had the potential to improve the incorporation of alumina particles in aluminum melts, with respect to MMC formation by the plasma transferred arc surfacing process.