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Quantitative characterization of micro-topography a bibliography of industrial surface metrology

R.J. Pike, +1 more
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In this article, the authors propose a 3.3-approximation algorithm for the 3.1-GHz bandit-16.3 GHz frequency bandit model, and
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Surface roughness measurement by means of speckle wavelength decorrelation

TL;DR: In this article, the authors exploit speckle wavelength decorrelation techniques for the characterization of surface roughness up to a few microns, using an argon laser, a grating, two photodetectors, and a commercial cross correlator.
Journal ArticleDOI

Digital Terrain Modeling and Industrial Surface Metrology: Converging Realms

TL;DR: In this article, the authors introduce industrial surface metrology, examines the field in the context of terrain modeling a.k.a. surface topography of manufactured components, exemplified by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography.
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Interdependence of Amplitude Roughness Parameters on Rough Gaussian Surfaces

TL;DR: The numerical analysis of 17 standardized amplitude roughness parameters collected from 90000 computer-generated rough surfaces revealed so far undetected interdependencies among some of these parameters, namely the results show a strong linear relation between 12 amplituderoughness parameters.
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Digital terrain modelling and industrial surface metrology — converging crafts

TL;DR: This paper introduces terrain modelling and compares it with metrology, noting their differences and similarities and one of the many issues common to both disciplines.
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Nano-metrology and terrain modelling - convergent practice in surface characterisation

TL;DR: In this paper, the authors introduce terrain modelling, discuss its similarities to and differences from industrial surface metrology, and raise the possibility of a unified discipline of quantitative surface characterisation, and exemplify a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data.
References
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The elastic contact of a rough surface

A.W. Bush, +2 more
- 01 Nov 1975 - 
TL;DR: In this paper, the elastic contact of an isotropically rough surface with a plane is treated by approximating the summits of a random process model by paraboloids with the same principal curvatures and applying the classical Hertzian solution for their deformation.
Journal ArticleDOI

Fractal characterization and simulation of rough surfaces

TL;DR: In this paper, the fractal dimension is identified as an intrinsic property of a multiscale structure and the Weierstrass-Mandelbrot (W-M) fractal function is used to introduce a new and simple method of roughness characterization.
Book

Handbook of Surface Metrology

TL;DR: Dowson et al. as mentioned in this paper defined surface metrology as "the nature of SURFACES and the signals obtained from them" and defined a set of definitions for surface metroglobalization.
Book

Random Field Models in Earth Sciences

TL;DR: Prolegomena the spatial random field model the intrinsic spatial randomField model the factorable random fieldModel the spatiotemporal random fieldmodel space transformations of random fields random field modelling of natural processes simulation of natural process estimation in space and time sampling design.