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Quantitative characterization of micro-topography a bibliography of industrial surface metrology
R.J. Pike,T.R. Thomas +1 more
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In this article, the authors propose a 3.3-approximation algorithm for the 3.1-GHz bandit-16.3 GHz frequency bandit model, andAbstract:
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Surface roughness measurement by means of speckle wavelength decorrelation
M. Giglio,S. Musazzi,U. Perini +2 more
TL;DR: In this article, the authors exploit speckle wavelength decorrelation techniques for the characterization of surface roughness up to a few microns, using an argon laser, a grating, two photodetectors, and a commercial cross correlator.
Journal ArticleDOI
Digital Terrain Modeling and Industrial Surface Metrology: Converging Realms
TL;DR: In this article, the authors introduce industrial surface metrology, examines the field in the context of terrain modeling a.k.a. surface topography of manufactured components, exemplified by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography.
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Interdependence of Amplitude Roughness Parameters on Rough Gaussian Surfaces
TL;DR: The numerical analysis of 17 standardized amplitude roughness parameters collected from 90000 computer-generated rough surfaces revealed so far undetected interdependencies among some of these parameters, namely the results show a strong linear relation between 12 amplituderoughness parameters.
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Digital terrain modelling and industrial surface metrology — converging crafts
TL;DR: This paper introduces terrain modelling and compares it with metrology, noting their differences and similarities and one of the many issues common to both disciplines.
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Nano-metrology and terrain modelling - convergent practice in surface characterisation
TL;DR: In this paper, the authors introduce terrain modelling, discuss its similarities to and differences from industrial surface metrology, and raise the possibility of a unified discipline of quantitative surface characterisation, and exemplify a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data.
References
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Active and passive microwave signature catalog on bare soil (2-12 GHz)
TL;DR: Detailed ground-truth information was collected including highly accurate surface roughness profiles in the RASAM ground-based radiometer-scatterometer system, which measures brightness temperatures and backscattering coefficients at frequencies between 2 and 12 GHz.
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Numerical simulation of friction between contacting rough surfaces
TL;DR: In this article, a model for predicting the friction of contacting rough surfaces is presented, where numerical simulation techniques are used to generate randomly rough surfaces with Gaussian statistics, and an elastic Hertzian analysis is then used to calculate the contact of each generated surface with a rigid, perfectly smooth, half plane of specified applied load.
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Determining surface roughness and displacement height
TL;DR: In this paper, a criterion for selecting the displacement height and the surface roughness is introduced, which requires a minimum value for the error squares between the observed and a calculated wind speed profile as determined by diabatic surface layer theory.
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The influence of surface roughness on the capacitance between a sphere and a plane
TL;DR: In this paper, the problem of capacitance between a rough sphere and a rough plane very close to each other is studied by gathering the roughness of both members onto the plane, and the results of two experiments, during which the derivative of the capacitance with respect to the separation is recorded, are considered.
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Experimental measurements of non-Gaussian scattering by a fractal diffuser
TL;DR: In this paper, the authors report measurements of the statistics of intensity scintillations of 10.6 μm CO2 radiation scattered by a two-dimensional fractal phase screen.