scispace - formally typeset
OtherDOI

Quantitative characterization of micro-topography a bibliography of industrial surface metrology

R.J. Pike, +1 more
Reads0
Chats0
TLDR
In this article, the authors propose a 3.3-approximation algorithm for the 3.1-GHz bandit-16.3 GHz frequency bandit model, and
Abstract
3

read more

Content maybe subject to copyright    Report

Citations
More filters

Surface roughness measurement by means of speckle wavelength decorrelation

TL;DR: In this article, the authors exploit speckle wavelength decorrelation techniques for the characterization of surface roughness up to a few microns, using an argon laser, a grating, two photodetectors, and a commercial cross correlator.
Journal ArticleDOI

Digital Terrain Modeling and Industrial Surface Metrology: Converging Realms

TL;DR: In this article, the authors introduce industrial surface metrology, examines the field in the context of terrain modeling a.k.a. surface topography of manufactured components, exemplified by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography.
Journal ArticleDOI

Interdependence of Amplitude Roughness Parameters on Rough Gaussian Surfaces

TL;DR: The numerical analysis of 17 standardized amplitude roughness parameters collected from 90000 computer-generated rough surfaces revealed so far undetected interdependencies among some of these parameters, namely the results show a strong linear relation between 12 amplituderoughness parameters.
Journal ArticleDOI

Digital terrain modelling and industrial surface metrology — converging crafts

TL;DR: This paper introduces terrain modelling and compares it with metrology, noting their differences and similarities and one of the many issues common to both disciplines.
Journal ArticleDOI

Nano-metrology and terrain modelling - convergent practice in surface characterisation

TL;DR: In this paper, the authors introduce terrain modelling, discuss its similarities to and differences from industrial surface metrology, and raise the possibility of a unified discipline of quantitative surface characterisation, and exemplify a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data.
References
More filters
Journal ArticleDOI

Surface roughness in wear

TL;DR: In this article, the average maximum surface roughness was measured for lubricated and unlubricated sliding conditions and compared with the mean wear particle size, and the roughness approach a value independent of initial conditions, and determined by dynamic equilibrium.
Journal ArticleDOI

Effects of static loading on surface parameters

TL;DR: In this article, the deformation of a roughened surface by a harder flat surface was calculated from digitised surface records taken with a relocation profilometer after each increment of load.
Journal ArticleDOI

High-speed video photographs of lubrication breakdown in squeeze-sliding contact

TL;DR: The main part of breakdown of a lubricating film will appear at the end of the contact time for a contact simultaneously subjected to squeeze and sliding motion as discussed by the authors, which corresponds with earlier findings using totally different equipment for electric detection of the asperity contact.
Journal ArticleDOI

The Surface-Roughness of Bearing-Surfaces and its Relation to Oil Film Thickness at Breakdown

A. Cameron
TL;DR: In this article, the relation of surface roughness of bearing surfaces to allowable film thickness is studied quantitatively with a simple Michell pad apparatus, and it is shown that the onset of metal to metal contact was detected by an increase in the frictional drag and also by the change in electrical conductivity between the pad and collar.
Journal ArticleDOI

The influence of surface roughness on electronic transport in thin films

TL;DR: In this article, the authors discuss STM imaging of various metal films and the application of these results to the interpretation of electronic thin-film properties, provided reasonable resolution of STM in the nm range.