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Quantitative characterization of micro-topography a bibliography of industrial surface metrology

R.J. Pike, +1 more
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In this article, the authors propose a 3.3-approximation algorithm for the 3.1-GHz bandit-16.3 GHz frequency bandit model, and
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Surface roughness measurement by means of speckle wavelength decorrelation

TL;DR: In this article, the authors exploit speckle wavelength decorrelation techniques for the characterization of surface roughness up to a few microns, using an argon laser, a grating, two photodetectors, and a commercial cross correlator.
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Digital Terrain Modeling and Industrial Surface Metrology: Converging Realms

TL;DR: In this article, the authors introduce industrial surface metrology, examines the field in the context of terrain modeling a.k.a. surface topography of manufactured components, exemplified by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography.
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Interdependence of Amplitude Roughness Parameters on Rough Gaussian Surfaces

TL;DR: The numerical analysis of 17 standardized amplitude roughness parameters collected from 90000 computer-generated rough surfaces revealed so far undetected interdependencies among some of these parameters, namely the results show a strong linear relation between 12 amplituderoughness parameters.
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Digital terrain modelling and industrial surface metrology — converging crafts

TL;DR: This paper introduces terrain modelling and compares it with metrology, noting their differences and similarities and one of the many issues common to both disciplines.
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Nano-metrology and terrain modelling - convergent practice in surface characterisation

TL;DR: In this paper, the authors introduce terrain modelling, discuss its similarities to and differences from industrial surface metrology, and raise the possibility of a unified discipline of quantitative surface characterisation, and exemplify a multivariate statistical procedure that may transfer to tribological applications of 3-D metrological height data.
References
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Remote sensing of the Earth's surface with an airborne polarized laser

TL;DR: Results from data flights taken over boreal forests in Maine at 1060 and 532 nm, using a Nd:YAG laser source, showing depolarization signatures for three broadleaf and five coniferous tree species are discussed.
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ZnCdSe/ZnCdMgSe quantum wells on InP substrates for visible emitters

Abstract: We have grown ZnCdSe/ZnCdMgSe quantum well (QW) structures nearly lattice matched to InP substrates. Emission energies from 2.307 to 2.960 eV were measured by low‐temperature photoluminescence at 10 K for samples with QW thicknesses between 5 and 80 A. By using exactly lattice‐matched QWs, the lower limit of the energy range can be lowered to about 2.2 eV (at 10 K). We propose that these structures could be used in entirely lattice‐matched semiconductor lasers operating at room temperature in the blue, green, and yellow regions. Because of the absence of strain, these materials are expected to be less prone to degradation than the current blue‐green lasers grown on GaAs.
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Behavior of cement based matrices reinforced by randomly dispersed microfibers

TL;DR: In this paper, a study on the behavior of cement-based matrices reinforced by randomly distributed microfibers is summarized, and the results show that fracture properties can be predicted by incorporating the obtained matrix fracture properties, fiber aspect ratio, and fiber matrix interface bond into a fracture mechanical R-curve approach.
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CW laser machining of hard ceramics—II. Effects of multiple reflections

TL;DR: In this article, the beam guiding effects during laser machining of ceramics due to multiple reflections in the groove are analyzed theoretically for two extreme cases, purely specular and purely diffuse reflections.
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Surface fractal dimension of graphitized carbon black particles

TL;DR: In this article, the surface fractal dimension of graphitized carbon black is 2.0 ± 0.1 and is independent of carbon black grade using the molecular yardstick method.