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Reliability of visible GaN LEDs in plastic package

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This article is published in Microelectronics Reliability.The article was published on 2003-09-01. It has received 49 citations till now. The article focuses on the topics: Reliability (semiconductor) & Gallium nitride.

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Journal ArticleDOI

Light emitting diodes reliability review

TL;DR: This paper provides the groundwork for an understanding of the reliability issues of LEDs across the supply chain and identifies the relationships between failure causes and their associated mechanisms, issues in thermal standardization, and critical areas of investigation and development in LED technology and reliability.
Journal ArticleDOI

Increasing the reliability of solid state lighting systems via self-healing approaches: A review

TL;DR: Self-healing concepts will be proposed to further improve LED’s reliability in order to increase reliability of SSL devices, components presenting self-repairing properties could be implemented.
Journal ArticleDOI

Long-term accelerated current operation of white light-emitting diodes

TL;DR: In this article, the degradation of white light-emitting diodes based on InGaN was performed under accelerated current conditions, and the half-life of the light's output was estimated.
Journal ArticleDOI

Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test

TL;DR: In this article, the performance of high-power light-emitting diode (LED) modules encapsulated with different lens shapes after a thermal aging test were studied experimentally and numerically.
Journal ArticleDOI

High Thermal Stability of Phosphor-Converted White Light-Emitting Diodes Employing Ce:YAG-Doped Glass

TL;DR: In this article, a high thermal stability of phosphor-converted white light-emitting diodes (PC-WLEDs) using Ce:YAG-doped glass (CeYDG) as a PC layer is proposed and fabricated.
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