Journal ArticleDOI
Surface blistering of ion irradiated SiC studied by grazing incidence electron microscopy
TLDR
In this article, the structural analysis of surface blisters on SiC crystals heavily irradiated by He+ and H+ ions using grazing incidence electron microscopy and electron energy-loss spectroscopy is presented.About:
This article is published in Journal of Nuclear Materials.The article was published on 2002-12-01. It has received 18 citations till now. The article focuses on the topics: Silicon & Blisters.read more
Citations
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Journal ArticleDOI
Space weathered rims found on the surfaces of the Itokawa dust particles
Takaaki Noguchi,Makoto Kimura,Takahito Hashimoto,Mitsuru Konno,Tomoki Nakamura,Michael E. Zolensky,Ryuji Okazaki,Masahiko Tanaka,Akira Tsuchiyama,Aiko Nakato,Toshinori Ogami,Hatsumi Ishida,Ryosuke Sagae,S. Tsujimoto,Toru Matsumoto,Junya Matsuno,Akio Fujimura,M. Abe,Toru Yada,Toshifumi Mukai,Munetaka Ueno,Tatsuaki Okada,Kei Shirai,Yukihiro Ishibashi +23 more
TL;DR: In this article, the authors identified three types of surface modification probably formed by space weathering on the surfaces of Itokawa particles: redeposition rims, composite rims and composite vesicular rims.
Journal ArticleDOI
Diffusion of fission products and radiation damage in SiC
TL;DR: In this paper, the diffusion of the important fission products (silver, caesium, iodine and strontium) in polycrystalline 3C-SiC is discussed.
Journal ArticleDOI
Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation
TL;DR: In this article, the authors investigated the formation of blisters on single and polycrystalline tungsten surfaces formed by hydrogen and helium ion irradiation with an ultra-high-voltage transmission electron microscope.
Journal ArticleDOI
Surface and internal microstructure damage of He-ion-irradiated CLAM steel studied by cross-sectional transmission electron microscopy
TL;DR: In this paper, the authors examined the internal and surface microstructure of He + ion irradiated CLAM steel by cross-sectional transmission electron microscopy combining focused ion beam and found that the formation of a zone of large bubbles under the surface is the main reason of surface blistering and flaking.
Journal ArticleDOI
The stability of vacancy clusters and their effect on helium behaviors in 3C-SiC
Jingjing Sun,Jingjing Sun,B.S. Li,Yu-Wei You,Jie Hou,Jie Hou,Yichun Xu,Changsong Liu,Q.F. Fang,Z.G. Wang +9 more
TL;DR: In this article, the stability of vacancy clusters and their effect on helium behaviors in 3C-SiC was investigated. And the three-dimensional electron density was calculated to analyze the interplay of vacancy cluster with helium.
References
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Book
CRC Handbook of Chemistry and Physics
TL;DR: CRC handbook of chemistry and physics, CRC Handbook of Chemistry and Physics, CRC handbook as discussed by the authors, CRC Handbook for Chemistry and Physiology, CRC Handbook for Physics,
Book
Electron Energy-Loss Spectroscopy in the Electron Microscope
Ray F. Egerton,Dale E. Newbury +1 more
TL;DR: In this article, the authors present an overview of the basic principles of energy-loss spectroscopy, including the use of the Wien filter, and the analysis of the inner-shell of the detector.
Book
The Stopping and Ranges of Ions in Matter
James F. Ziegler,J.P. Biersack +1 more
TL;DR: In this article, the authors reviewed the calculation of the stopping and the final range distribution of ions in matter, and showed the development of ion penetration theory by tracing how, as the theory developed through the years, various parts have been incorporated into tables and increased their accuracy.
Journal ArticleDOI
Silicon on insulator material technology
TL;DR: In this article, a silicon on insulator material technology based on wafer bonding is described, in which a heat treatment induces an in-depth microslicing of one of the two bonded wafers previously implanted with hydrogen.
Journal ArticleDOI
Helium desorption/permeation from bubbles in silicon: A novel method of void production
TL;DR: In this article, the annealing behavior of helium bubbles formed by helium implantation into silicon has been studied using both helium desorption spectroscopy and transmission electron microscopy.