Journal ArticleDOI
Surface Studies of Solids by Total Reflection of X-Rays
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In this paper, the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection was analyzed to study certain structural properties of the mirror surface about 10 to several hundred angstroms deep.Abstract:
Analysis of the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection provides a new method of studying certain structural properties of the mirror surface about 10 to several hundred angstroms deep. Dispersion theory, extended to treat any (small) number of stratified homogeneous media, is used as a basis of interpretation.Curves for evaporated copper on glass at room temperature are studied as an example. These curves may be explained by assuming that the copper (exposed to atmospheric air at room temperature) has completely oxidized about 150A deep. If oxidation is less deep, there probably exists some general reduction of density (e.g., porosity) and an electron density minimum just below an internal oxide seal. This seal, about 25A below the nominal surface plane, arrests further oxidation of more deeply-lying loose-packed copper crystallites.All measurements to date have been carried out under laboratory atmospheric conditions which do not allow satisfactory separation or control of the physical and chemical variables involved in the surface peculiarities. The method, under more controlled conditions of preparation and treatment of the surface, promises to be useful.read more
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Enhancement of mechanical and tribological properties in AISI D3 steel substrates by using a non-isostructural CrN/AlN multilayer coating
TL;DR: In this article, the performance of CrN/AlN multilayer coatings has been investigated in terms of structural, chemical, morphological, mechanical and tribological properties by X-ray diffraction.
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Exchange-coupled FePt/Fe bilayers with perpendicular magnetisation
TL;DR: In this paper, a bilayer made up of a hard (FePt) and soft (Fe) phase coupled by exchange interactions is fabricated with the easy-magnetisation direction perpendicular to the film plane.
Journal ArticleDOI
Interfacial structure in semiconducting polymer devices
Anthony M. Higgins,Simon J. Martin,P. C. Jukes,Mark Geoghegan,Richard A. L. Jones,Sean Langridge,Robert Cubitt,Stephan Kirchmeyer,Anja Wehrum,Ilaria Grizzi +9 more
TL;DR: In this paper, the structure of interfaces in semiconducting polymer devices was characterized via neutron reflectivity and scanning force microscopy, and it was shown that the interface between an insulating polymer and a semiconductor polymer is not molecularly sharp, but is rather broad with a width typically of the order of 1 nm.
Journal ArticleDOI
Subsurface Influence on the Structure of Protein Adsorbates as Revealed by in Situ X-ray Reflectivity
Hendrik Hähl,Florian Evers,Samuel Grandthyll,Michael Paulus,Christian Sternemann,Peter Loskill,Matthias Lessel,Anne K. Hüsecken,Thorsten Brenner,Metin Tolan,Karin Jacobs +10 more
TL;DR: The results imply that van der Waals forces mainly influence surface processes, which govern the structure formation of the protein adsorbates, such as surface diffusion and spreading.
Journal ArticleDOI
Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands
TL;DR: In this article, the current status of and recent achievements by the Institute for Physics of Microstructures of the Russian Academy of Sciences (RAS) in the field are discussed.