Journal ArticleDOI
Surface Studies of Solids by Total Reflection of X-Rays
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TLDR
In this paper, the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection was analyzed to study certain structural properties of the mirror surface about 10 to several hundred angstroms deep.Abstract:
Analysis of the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection provides a new method of studying certain structural properties of the mirror surface about 10 to several hundred angstroms deep. Dispersion theory, extended to treat any (small) number of stratified homogeneous media, is used as a basis of interpretation.Curves for evaporated copper on glass at room temperature are studied as an example. These curves may be explained by assuming that the copper (exposed to atmospheric air at room temperature) has completely oxidized about 150A deep. If oxidation is less deep, there probably exists some general reduction of density (e.g., porosity) and an electron density minimum just below an internal oxide seal. This seal, about 25A below the nominal surface plane, arrests further oxidation of more deeply-lying loose-packed copper crystallites.All measurements to date have been carried out under laboratory atmospheric conditions which do not allow satisfactory separation or control of the physical and chemical variables involved in the surface peculiarities. The method, under more controlled conditions of preparation and treatment of the surface, promises to be useful.read more
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Journal ArticleDOI
Asymmetric diffusion at the interfaces in Fe/Si multilayers
TL;DR: In this paper, depth-dependent interdiffusion in a Si/Fe/Si trilayer has been studied with sub-nanometer depth resolution using x-ray standing waves, yielding an intriguing result that Fe diffusivity at the two interfaces is not symmetric.
Journal ArticleDOI
Physical properties of epitaxial ZrN/MgO(001) layers grown by reactive magnetron sputtering
Antonio B. Mei,Brandon M. Howe,Can Zhang,M. Sardela,James N. Eckstein,Lars Hultman,Angus Rockett,Ivan Petrov,Ivan Petrov,Joseph E Greene,Joseph E Greene +10 more
TL;DR: In this article, a combination of high-resolution x-ray diffraction reciprocal lattice maps, highresolution cross-sectional transmission electron microscopy, and selected-area electron diffraction was used to show that ZrN grows epitaxially on MgO(001) with a cube-on-cube orientational relationship.
Journal ArticleDOI
Operando Measurement of Solid Electrolyte Interphase Formation at Working Electrode of Li-Ion Battery by Time-Slicing Neutron Reflectometry
Hiroyuki Kawaura,Masashi Harada,Yasuhito Kondo,Hiroki Kondo,Yoshitake Suganuma,Naoko Takahashi,Jun Sugiyama,Yoshiki Seno,Norifumi L. Yamada +8 more
TL;DR: The first operando measurement of solid electrolyte interphase (SEI) formation at an electrode using in situ neutron reflectometry revealed the growth of the SEI and intercalation of ions during the charge reaction.
Journal ArticleDOI
Strain gradients in Al-2% Cu thin films
Carla J Shute,Jerome B. Cohen +1 more
TL;DR: In this paper, the strain gradient through the thickness of 0.5, 1.0, and 2.0mm-thick Al-2% Cu films on oxidized (001) Si wafers has been examined by using glancing-angle x-ray diffraction to measure the d spacing as a function of penetration depth of the incident x•ray beam.
Journal ArticleDOI
High mobility indium zinc oxide thin film field-effect transistors by semiconductor layer engineering.
Daniel Walker,Marton Major,Mehrdad Baghaie Yazdi,Andreas Klyszcz,Marc Haeming,Klaus Bonrad,Christian Melzer,Wolfgang Donner,Heinz von Seggern +8 more
TL;DR: A consistent qualitative model of layer formation is developed explaining how the morphology of the film develops as the concentration of precursor in the initial solution is varied, leading to a dense, defect and void free film, affording the highest mobilities.