Journal ArticleDOI
Surface Studies of Solids by Total Reflection of X-Rays
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In this paper, the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection was analyzed to study certain structural properties of the mirror surface about 10 to several hundred angstroms deep.Abstract:
Analysis of the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection provides a new method of studying certain structural properties of the mirror surface about 10 to several hundred angstroms deep. Dispersion theory, extended to treat any (small) number of stratified homogeneous media, is used as a basis of interpretation.Curves for evaporated copper on glass at room temperature are studied as an example. These curves may be explained by assuming that the copper (exposed to atmospheric air at room temperature) has completely oxidized about 150A deep. If oxidation is less deep, there probably exists some general reduction of density (e.g., porosity) and an electron density minimum just below an internal oxide seal. This seal, about 25A below the nominal surface plane, arrests further oxidation of more deeply-lying loose-packed copper crystallites.All measurements to date have been carried out under laboratory atmospheric conditions which do not allow satisfactory separation or control of the physical and chemical variables involved in the surface peculiarities. The method, under more controlled conditions of preparation and treatment of the surface, promises to be useful.read more
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Nanoparticle concentration profile in polymer-based solar cells
Jonathan W. Kiel,Jonathan W. Kiel,Brian J. Kirby,Charles F. Majkrzak,Brian B. Maranville,Michael E. Mackay +5 more
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Diffuse-double layer at a membrane-aqueous interface measured with x-ray standing waves.
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Journal ArticleDOI
The thickness of native oxides on aluminum alloys and single crystals
Jonas Evertsson,Florian Bertram,Fan Zhang,Lisa Rullik,Lindsay R. Merte,Mikhail Shipilin,Markus Soldemo,Sareh Ahmadi,Nikolay A. Vinogradov,Franceso Carlà,Jonas Weissenrieder,Mats Göthelid,Jinshan Pan,Anders Mikkelsen,Jan-Olov Nilsson,Edvin Lundgren +15 more
TL;DR: In this paper, the results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals were determined using X-ray reflectivity, Xray photo-electron spectroscopy, and electrochemical impedance spectroglobalization.
Journal ArticleDOI
Total reflection x‐ray fluorescence analysis—a review
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Journal ArticleDOI
Solid Electrolyte Interphase on Native Oxide-Terminated Silicon Anodes for Li-Ion Batteries
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TL;DR: In this paper, the formation process and structure of the solid electrolyte interphase (SEI) layer on native oxide-terminated silicon wafer anodes from a carbonate-based electrolyte (LP30) were studied.