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David J. Srolovitz

Researcher at City University of Hong Kong

Publications -  557
Citations -  30310

David J. Srolovitz is an academic researcher from City University of Hong Kong. The author has contributed to research in topics: Grain boundary & Dislocation. The author has an hindex of 87, co-authored 540 publications receiving 27162 citations. Previous affiliations of David J. Srolovitz include Los Alamos National Laboratory & University of Pennsylvania.

Papers
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A comparison of crystal-melt interfacial free energies using different Al potentials

TL;DR: In this article, the crystal-melt interfacial stiffnesses were calculated using simulations with three different interatomic potentials for Al, and from these derived the anisotropic crystal-melter interfacial free energies.
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Transition from lateral to transverse phase separation during film co‐deposition

TL;DR: In this article, two distinct types of phase-separated microstructures in co-deposited Al-Ge films were observed, with a temperature dependence consistent with surface diffusion.
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(100) surface segregation in Cu-Ni alloys

TL;DR: A simpler method for determining the equilibrium segregation in terms of the properties of unrelaxed pure Ni and pure Cu surface data is proposed and shown to be more accurate than the existing empirical segregation analyses.
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Impurity effects on domain-growth kinetics. II. Potts model

TL;DR: It is found that the domain growth becomes pinned for quenches to T = 0 and the average pinned domain area A/sub f/ varies inversely with the concentration c of impurities.
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Effects of ion beams on the early stages of MgO growth

TL;DR: In this article, the effects of ion beams in selecting MgO island orientations during ion beam assisted deposition were examined and a new analytical model parameterized using the molecular dynamics sputter yield data was developed which predicts how growth conditions affect these island orientation-dependent nucleation rates.