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David J. Srolovitz

Researcher at City University of Hong Kong

Publications -  557
Citations -  30310

David J. Srolovitz is an academic researcher from City University of Hong Kong. The author has contributed to research in topics: Grain boundary & Dislocation. The author has an hindex of 87, co-authored 540 publications receiving 27162 citations. Previous affiliations of David J. Srolovitz include Los Alamos National Laboratory & University of Pennsylvania.

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Properties on the edge: graphene edge energies, edge stresses, edge warping, and the Wulff shape of graphene flakes

TL;DR: In this article, the edge energies and edge stresses of graphene nanoribbons with arbitrary orientations from armchair to zigzag were investigated, considering both flat and warped edge shapes in the presence and absence of hydrogen.
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Level set simulation of dislocation dynamics in thin films

TL;DR: In this article, a level set method-based, three-dimensional dislocation dynamics simulation method was developed to describe the motion of dislocations in a heteroepitaxial thin film.
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MoS2 edges and heterophase interfaces: energy, structure and phase engineering

TL;DR: In this article, the energy properties of the transition metal dichalcogenides were investigated and a systematic investigation of the experimentally most important MoS2 heterophase interfaces and edges was performed.
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Sintering and microstructure evolution in columnar thermal barrier coatings

TL;DR: In this paper, a model for the sintering of individual columns using a thermodynamic principle, and incorporating the center-to-center approach rates for the columns calculated using this principle in a larger scale discrete dynamics model was presented.
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Scaling of dislocation cell structures: diffusion in orientation space

TL;DR: In this article, the authors examine the idea that the evolution of self-organizing dislocation cells is dominated by random fluctuations in cell orientation and propose an orientation equivalent of Fick's second law to get a time-dependent solution for the orientation distributions, misorientation distributions and the strain dependence of the average misoriented angle.