D
David J. Srolovitz
Researcher at City University of Hong Kong
Publications - 557
Citations - 30310
David J. Srolovitz is an academic researcher from City University of Hong Kong. The author has contributed to research in topics: Grain boundary & Dislocation. The author has an hindex of 87, co-authored 540 publications receiving 27162 citations. Previous affiliations of David J. Srolovitz include Los Alamos National Laboratory & University of Pennsylvania.
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Atomistic simulations of stress and microstructure evolution during polycrystalline Ni film growth
TL;DR: In this article, molecular dynamics simulations of Ni bicrystal film growth were performed and it was shown that the film stress-thickness product is compressive and oscillatory with a period that is approximately equal to one monolayer.
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Atomistic simulations of surface relaxations in Ni, Al, and their ordered alloys
TL;DR: In this article, the atomistic nature of surface relaxations in pure metals and ordered alloys was examined and it was shown that the surface relaxation (..delta..d/sub n,n+1/) is oscillatory and to decay rapidly into the bulk.
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Thermodynamic and structural properties of [001] twist boundaries in gold
TL;DR: In this article, the authors employed the Local Harmonic (LH) model and the Embedded Atom Method (EAM) to examine the structural and thermodynamic properties of a series of twelve (001) twist boundaries in gold for temperatures between 0 K and 700 K.
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Analysis and design principles for shear-mode piezoelectric energy harvesting with ZnO nanoribbons
TL;DR: In this article, a comprehensive theory addressed the potential for nanoscale energy harvesting with an array of vertically aligned zinc oxide (ZnO) nanoribbons through shear-mode piezoelectric coupling.
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Buckling and post-buckling kinetics of compressed thin films on viscous substrates
TL;DR: In this paper, a linear stability analysis of compressively-stressed elastic films on viscous substrates is presented, which is extended to include interfacial shear stresses and shear deformation of the film.