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David J. Srolovitz

Researcher at City University of Hong Kong

Publications -  557
Citations -  30310

David J. Srolovitz is an academic researcher from City University of Hong Kong. The author has contributed to research in topics: Grain boundary & Dislocation. The author has an hindex of 87, co-authored 540 publications receiving 27162 citations. Previous affiliations of David J. Srolovitz include Los Alamos National Laboratory & University of Pennsylvania.

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Impurity effects on adhesion: Nb, C, O, B, and S at a Mo/MoSi2 interface.

TL;DR: Adhesive energies, peak interfacial strengths, and bonding characteristics are found to be strongly dependent upon impurity-atom type, and the interfacial spacings increase in proportion to impurity covalent radii.
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Nonuniform and directional grain growth caused by grain boundary mobility variations

TL;DR: In this article, a simulation of grain growth in which boundary mobility varies in time and/or space has been performed, showing that grain growth is equiaxed and normal at low and high profile velocities.
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Anatomy of nanomaterial deformation: Grain boundary sliding, plasticity and cavitation in nanocrystalline Ni

TL;DR: In this article, the size-dependent deformation of nanocrystalline Ni nanowires for a range of diameters spanning a few nanometers to the bulk was analyzed using large-scale molecular dynamics simulations.
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The grain boundary mobility tensor.

TL;DR: It is argued that the mobility is, in general, a tensor (classically, it is a scalar) and determine all of its components and demonstrated that stress generation during GB migration necessarily slows grain growth and reduces GB mobility in polycrystals.