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David W Parent
Researcher at San Jose State University
Publications - 55
Citations - 333
David W Parent is an academic researcher from San Jose State University. The author has contributed to research in topics: Transistor & Metalorganic vapour phase epitaxy. The author has an hindex of 8, co-authored 53 publications receiving 299 citations. Previous affiliations of David W Parent include University of California, Santa Cruz & University of Connecticut.
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Removal of threading dislocations from patterned heteroepitaxial semiconductors by glide to sidewalls
TL;DR: In this article, the authors show that threading dislocations can be removed from patterned heteroepitaxial semiconductors by glide to the sidewalls, which is driven by the presence of image forces.
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The influence of personality and ability on undergraduate teamwork and team performance
TL;DR: In this paper, the authors explored correlations between team outcomes, personality measures and ability in an undergraduate population, and found that personality, in terms of extraversion scores, was positively correlated with instructors' assessment of team performance, which is consistent with prior research.
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Comparison of X-ray diffraction methods for determination of the critical layer thickness for dislocation multiplication
TL;DR: In this article, a comparison of x-ray diffraction methods for the determination of the critical layer thickness for dislocation multiplication in mismatched heteroepitaxy was presented.
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Improvements to a microelectronic design and fabrication course
TL;DR: Improvements made to a complimentary metal-oxide-semiconductor fabrication laboratory course to increase student learning and student impact (enrollment).
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X-ray rocking curve analysis of tetragonally distorted ternary semiconductors on mismatched (001) substrates
TL;DR: For ternary heteroepitaxial layers, the independent determination of the composition and state of strain requires x-ray rocking curve measurements for at least two different hkl reflections as discussed by the authors.