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Journal ArticleDOI

A 14-b 20-Msamples/s CMOS pipelined ADC

TLDR
Capacitor error-averaging offers an advantage of achieving both INL and DNL improvements over that achievable by capacitor matching, but it requires three clock phases-one extra clock phase for averaging capacitor errors.
Abstract
The performance of high-resolution pipelined ADCs is limited by the residue amplifier gain and settling accuracy. In typical implementations, error sources are capacitor ratio mismatch, op-amp gain, and residue settling. All these affect ADC performance adversely, specifically in high-speed ADCs. Capacitor matching improves as capacitor size increases, but the trend is towards shrinking capacitor size for high-speed conversion. Many innovations to overcome this such as ratio-independent techniques are reported. Among them, capacitor error-averaging offers an advantage of achieving both INL and DNL improvements over that achievable by capacitor matching, but it requires three clock phases-one extra clock phase for averaging capacitor errors. In this work, the one extra clock phase is used advantageously for comparison.

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Citations
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Journal ArticleDOI

A 14-b 12-MS/s CMOS pipeline ADC with over 100-dB SFDR

TL;DR: A 1.8-V 14-b 12-MS/s pseudo-differential pipeline analog-to-digital converter (ADC) using a passive capacitor error-averaging technique and a nested CMOS gain-boosting technique is described.
Journal ArticleDOI

A digitally enhanced 1.8-V 15-bit 40-MSample/s CMOS pipelined ADC

TL;DR: In this article, a 1.8-V 15-bit 40-MSample/s CMOS pipelined analog-to-digital converter with 90-dB spurious-free dynamic range (SFDR) and 72-dB peak SNR over the full Nyquist band is presented.
Journal ArticleDOI

A 15-bit Linear 20-MS/s Pipelined ADC Digitally Calibrated With Signal-Dependent Dithering

TL;DR: Significant nonlinearity is improved from 25 to 1.3 least significant bits (LSBs) after calibrating the first six stages and signal-dependent dithering scheme is introduced.
Book

Circuit Techniques for Low-Voltage and High-Speed A/D Converters

M. Waltari, +1 more
TL;DR: In this article, the authors present a number of low voltage low-voltage techniques, including double sampling with a MOS Transistor Switch, clock generation, and switched opAmp technique.
Journal ArticleDOI

A 14-bit 20-MS/s Pipelined ADC With Digital Distortion Calibration

TL;DR: A new digital distortion calibration technique is demonstrated in a 14-bit 20-MS/s pipelined analog-to-digital converter (ADC) and a 15-dB improvement of the third-order harmonic rejection is achieved.
References
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Journal ArticleDOI

A 12-bit 1-Msample/s capacitor error-averaging pipelined A/D converter

TL;DR: A capacitor error-averaging technique is applied to perform an accurate multiply-by-two (*2) function required in high-resolution pipelined analog-to-digital (A/D) converters, achieving a throughput rate of 1 Msample/s with 12 bits of linearity.
Journal ArticleDOI

A 2.5 V 12 b 5 MSample/s pipelined CMOS ADC

TL;DR: This 1.2 /spl mu/m, 33 mW analog-to-digital converter (ADC) demonstrates a family of power reduction techniques including a commutated feedback capacitor switching (CFCS), sharing of the second stage of an op amp between adjacent stages of a pipeline, reusing the first stage of a op amp as the comparator pre-amp, and exploiting parasitic capacitance as common-mode feedback capacitors.
Journal ArticleDOI

A 15 b 5 MSample/s low-spurious CMOS ADC

TL;DR: System partitioning and multi-stage calibration solve two fundamental problems of capacitor matching and finite opamp gain.
Journal ArticleDOI

A pipelined 13-bit 250-ks/s 5-V analog-to-digital converter

TL;DR: A pipelined, 13-bit, 250-ksample/s (ks/s), 5-V, analog-to-digital (A/D) converter has been designed and fabricated in a 3- mu m, CMOS technology.
Journal ArticleDOI

A 13-b 10-Msample/s ADC digitally calibrated with oversampling delta-sigma converter

TL;DR: Two key techniques necessary to digitally calibrate multistep or pipelined converters are demonstrated in a differential 5-V, 13-b, 10-Msample/s analog-to-digital converter (ADC) to linearize the transfer characteristic of digital- to-analog converters (DAC's) and evenly distribute interstage gain errors over the full conversion range.
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