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A Physical RC Network Model for Electrothermal Analysis of a Multichip SiC Power Module

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TLDR
In this paper, the authors used the finite-element (FE) model to provide the raw data for establishing the physical resistor-capacitor (RC) network model, where crossheating effects between the MOSFETs are represented with lateral thermal resistors.
Abstract
This paper is concerned with the thermal models which can physically reflect the heat-flow paths in a lightweight three-phase half-bridge two-level SiC power module with six MOSFETs and can be used for coupled electrothermal simulation. The finite-element (FE) model was first evaluated and calibrated to provide the raw data for establishing the physical resistor–capacitor (RC) network model. It was experimentally verified that the cooling condition of the module mounted on a water cooler can be satisfactorily described by assuming the water cooler as a heat exchange boundary in the FE model. The compact RC network consisting of 115 R and C parameters to predict the transient junction temperatures of the six MOSFETS was constructed, where cross-heating effects between the MOSFETs are represented with lateral thermal resistors. A three-step curve fitting method was especially developed to overcome the challenge for extracting the R and C values of the RC network from the selected FE simulation results. The established compact RC network model can physically be correlated with the structure and heat-flow paths in the power module, and was evaluated using the FE simulation results from the power module under realistic switching conditions. It was also integrated into the LTspice model to perform the coupled electrothermal simulation to predict the power losses and junction temperatures of the six MOSFETs under switching frequencies from 5 to 100 kHz which demonstrate the good electrothermal performance of the designed power module.

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Journal ArticleDOI

Evaluation of Aging's Effect on Temperature-Sensitive Electrical Parameters in SiC mosfets

TL;DR: In this article, the authors investigated the aging's impacts on various temperature sensitive electrical parameters (TSEPs) in SiC mosfets and found that the package degradation's impact on TSEPs was more significant than the gate oxide instability.
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Reliability Analysis on Power Converter of Switched Reluctance Machine System Under Different Control Strategies

TL;DR: A combination model of k-out-of-n:G model and Markov model is proposed to lower the complexity and enhance the accuracy of system-level reliability assessment and the increase in redundancy levels on power converter is certified as the most powerful measure for reliability enhancement of the SRM system.
Journal ArticleDOI

Design Methodology of DC Power Cycling Test Setup for SiC MOSFETs

TL;DR: Experimental results show that an accurate measurement can be achieved with the design considerations regarding precise parameter measurement of the device’s parameter, and the practical issues affecting the measurement accuracy in a multiple-phase setup are investigated.
Journal ArticleDOI

Online Junction Temperature Extraction of SiC Power mosfet s With Temperature Sensitive Optic Parameter (TSOP) Approach

TL;DR: In this paper, an online junction temperature extraction method is proposed based on the electroluminescence phenomenon of the body diode of SiC power mosfet s, which ascribes to the radiative recombination in the low doped region of the chip.
Journal ArticleDOI

Graphite-Embedded High-Performance Insulated Metal Substrate for Wide-Bandgap Power Modules

TL;DR: In this article, a graphite-embedded insulated metal substrate (thermally-annealed-pyrolytic-graphite embeddings) was proposed for widebandgap power modules.
References
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Journal ArticleDOI

Fine structure of heat flow path in semiconductor devices: a measurement and identification method

TL;DR: In this paper, a deconvolution operation performed in the logarithmic time domain gives the "timeconstant spectrum" of the chip-case-ambient thermal structure.
Journal ArticleDOI

Thermal Loading and Lifetime Estimation for Power Device Considering Mission Profiles in Wind Power Converter

TL;DR: In this paper, a relative more advanced approach is proposed, which is based on the loading and strength analysis of devices and takes into account different time constants of the thermal behaviors in power converter.
Journal ArticleDOI

Real-Time Compact Thermal Models for Health Management of Power Electronics

TL;DR: In this article, a real-time reduced-order compact thermal model is proposed for health assessment and thermal management of power electronic devices using a full bridge and a pulsewidth modulation and current controlled full bridge.
Journal ArticleDOI

Thermal component model for electrothermal analysis of IGBT module systems

TL;DR: In this article, the static and dynamic thermal behavior of IGBT module system mounted on a water-cooled heat sink is analyzed using an RC component model (RCCM) to extract thermal resistances and time constants.
Journal ArticleDOI

Simulating the dynamic electrothermal behavior of power electronic circuits and systems

TL;DR: In this article, the thermal component models for the device silicon chip, packages, and heat sinks are developed by discretizing the nonlinear heat diffusion equation and are represented in component form so that the thermal components can be readily connected to one another to form the thermal network.
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