Journal ArticleDOI
Automated lattice parameter measurement from HOLZ lines and their use for the measurement of oxygen content in YBa2Cu3O7-δ from nanometer-sized region
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TLDR
In this article, an algorithm is described which automatically adjusts values of lattice parameters or high voltage for best fit to the high-order Laue zone (HOLZ) lines in experimental convergent-beam electron diffraction (CBED) patterns for both cubic and non-cubic cell.About:
This article is published in Ultramicroscopy.The article was published on 1992-04-01. It has received 132 citations till now. The article focuses on the topics: Lattice constant.read more
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Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond.
TL;DR: The use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others are reviewed.
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Accurate measurements of mean inner potential of crystal wedges using digital electron holograms
Marija Gajdardziska-Josifovska,Martha R. McCartney,W.J. de Ruijter,David J. Smith,J. K. Weiss,Jian-Min Zuo +5 more
TL;DR: In this article, the mean inner potential of Si (9.26±0.08 V), MgO (13.01± 0.17 V), GaAs (14.53±0.,17 V) and PbS (17.19±0,12 V) was measured with high accuracy of about 1%.
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Measurement of the lattice misfit in the single crystal nickel based superalloys CMSX-4, SRR99 and SC16 by convergent beam electron diffraction
TL;DR: In this article, anomalous measurements in the nickel-based superalloys CMSX-4, SRR99 and SC16 have been performed applying the CBED method, and the results showed great differences of misfit values between the dendritic and interdendritic region of the alloys, especially in CMS X-4.
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Electron ptychography achieves atomic-resolution limits set by lattice vibrations
Zhen Chen,Yi Jiang,Yu-Tsun Shao,Megan E. Holtz,Michal Odstrcil,Manuel Guizar-Sicairos,Isabelle Hanke,Steffen Ganschow,Darrell G. Schlom,Darrell G. Schlom,David A. Muller +10 more
TL;DR: In this paper, the authors demonstrate an instrumental blurring of under 20 picometers by solving the multiple scattering problem and overcoming the aberrations of the electron probe using electron ptychography to recover a linear phase response in thick samples.
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Advanced electron microscopy for thermoelectric materials
TL;DR: In this article, a review of advanced electron microscopy (EM) techniques applied in thermoelectric (TE) materials can be found, including valence-electron distribution, quantitative measurement of atomic displacement, point defect characterization, local band gap measurement, phonon excitation detection, electrostatic potential determination, thermal stability of nanostructures and in-situ observation and measurement of local TE effects.
References
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Book
Introduction to solid state physics
TL;DR: In this paper, the Hartree-Fock Approximation of many-body techniques and the Electron Gas Polarons and Electron-phonon Interaction are discussed.
Book
Data Reduction and Error Analysis for the Physical Sciences
TL;DR: In this paper, Monte Carlo techniques are used to fit dependent and independent variables least squares fit to a polynomial least-squares fit to an arbitrary function fitting composite peaks direct application of the maximum likelihood.
Journal ArticleDOI
Data Reduction and Error Analysis for the Physical Sciences.
TL;DR: Numerical methods matrices graphs and tables histograms and graphs computer routines in Pascal and Monte Carlo techniques dependent and independent variables least-squares fit to a polynomial least-square fit to an arbitrary function fitting composite peaks direct application of the maximum likelihood.