Journal ArticleDOI
Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects
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TLDR
The high-amplitude dynamic response of cantilever structures as used in scanning force microscopy was investigated as a function of the probe-sample distance, and discontinuities observed in experimental amplitude-distance curves were attributed.Abstract:
The high-amplitude dynamic response of cantilever structures as used in scanning force microscopy was investigated as a function of the probe-sample distance. A computer simulation using the Muller-Yushchenko-Derjaguin/Burgess-Hughes-White (MYD/BHW) method applying realistic surface potentials including adhesion was done. The simulation providing dynamic force-distance curves allows us to attribute discontinuities observed in experimental amplitude-distance curves as the transition points from the purely attractive regime to the repulsive interaction near the lower inflection point of the vibrating probe. \textcopyright{} 1996 The American Physical Society.read more
Citations
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Journal ArticleDOI
Advances in atomic force microscopy
TL;DR: The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation AFM (FM-AFM), as well as other dynamic methods as discussed by the authors.
Journal ArticleDOI
Dynamic atomic force microscopy methods
Ricardo Garcia,Rubén Pérez +1 more
TL;DR: In this paper, the authors review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods and present a detailed quantitative comparison between theoretical simulations and experiment.
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A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences
TL;DR: The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of micro-structural parameters and unraveling the intermolecular forces at nanoscale level with atomic-resolution characterization as mentioned in this paper.
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Factors Affecting the Height and Phase Images in Tapping Mode Atomic Force Microscopy. Study of Phase-Separated Polymer Blends of Poly(ethene-co-styrene) and Poly(2,6-dimethyl-1,4-phenylene oxide)
TL;DR: In this paper, the relative contrast of chemically different regions depends sensitively on the driving amplitude A0 and set point amplitude ratio rsp = Asp/A0, where Asp is the set-point amplitude.
Journal ArticleDOI
Atomic force microscopy characterization of cellulose nanocrystals.
TL;DR: CNC properties were reasonably uniform along the entire CNC length, despite variations along the axis of 3-8 nm in CNC height, according to a detailed study of the topography, elastic and adhesive properties of individual wood-derived CNCs performed using atomic force microscopy.
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