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Facile encapsulation of oxide based thin film transistors by atomic layer deposition based on ozone.

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TLDR
A simplified encapsulation strategy for metal-oxide based TFTs, using ozone instead of water as an oxygen source in a low-temperature ALD process is demonstrated, ensuring the threshold voltage remains unaltered and the hysteresis is permanently reduced.
Abstract
A simplified encapsulation strategy for metal-oxide based TFTs, using ozone instead of water as an oxygen source in a low-temperature ALD process is demonstrated. Thereby, the threshold voltage remains unaltered and the hysteresis is permanently reduced. Costly energy- and time-consuming post-treatment processes can be avoided. This concept is widely applicable to various encapsulation materials (e.g., Al2 O3 , TiO2 , ZrO2 ) and metal-oxide channel semiconductors (e.g., zinc-tin-oxide (ZTO), indium-gallium-zinc-oxide (IGZO)).

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Citations
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Journal ArticleDOI

Stable and High-Performance Flexible ZnO Thin-Film Transistors by Atomic Layer Deposition.

TL;DR: This study demonstrates for the first time degradation-free passivation of ZnO TFTs by a TiO2/Al2O3 nanolaminated (TAO) film deposited by a low-temperature (110 °C) ALD process.
Journal ArticleDOI

A Sustainable Approach to Flexible Electronics with Zinc‐Tin Oxide Thin‐Film Transistors

TL;DR: In this paper, the performance of flexible zinc-tin oxide (ZTO) thin-film transistors (TFTs) processed at only 180 °C is reported. But no critical elements as In and Ga are used, device performance approaches the one of indium-gallium-zinc oxide TFTs.
Journal ArticleDOI

Highly conductive SnO2 thin films deposited by atomic layer deposition using tetrakis-dimethyl-amine-tin precursor and ozone reactant

TL;DR: In this article, high conductive SnO 2 thin films were grown by atomic layer deposition (ALD) in a wide growth temperature range (50°C-250°C), using a tetrakis-dimethyl-amine tin (TDMASn) precursor and an ozone reactant.
Journal ArticleDOI

Enhanced Light Stability of InGaZnO Thin-Film Transistors by Atomic-Layer-Deposited Y2O3 with Ozone.

TL;DR: It is envisioned that the O3-ALD Y2O3 passivation layer suggested in this paper can improve the photostability of TFTs under light illumination.
Journal ArticleDOI

Facile passivation of solution-processed InZnO thin-film transistors by octadecylphosphonic acid self-assembled monolayers at room temperature

TL;DR: In this paper, a simple passivation method is developed to overcome the water susceptibility of solution-processed InZnO thin-film transistors by utilizing octadecylphosphonic acid (ODPA) self-assembled monolayers (SAMs).
References
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Journal ArticleDOI

Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

TL;DR: A novel semiconducting material is proposed—namely, a transparent amorphous oxide semiconductor from the In-Ga-Zn-O system (a-IGZO)—for the active channel in transparent thin-film transistors (TTFTs), which are fabricated on polyethylene terephthalate sheets and exhibit saturation mobilities and device characteristics are stable during repetitive bending of the TTFT sheet.
Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Journal ArticleDOI

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

TL;DR: In this paper, the effect of water exposure on amorphous indium-gallium-zinc oxide (a-IGZO) semiconductors was investigated and two competing mechanisms depending on the thickness of the active channel were clarified.
Journal ArticleDOI

ZnO-based transparent thin-film transistors

TL;DR: In this article, the authors proposed a transparent ZnO-based thin-film transistors (TFTs) for select-transistors in each pixel of an active-matrix liquid-crystal display.
Journal ArticleDOI

High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer

TL;DR: In this article, transparent thin-film transistors (TTFTs) with an amorphous zinc tin oxide channel layer formed via rf magnetron sputter deposition are demonstrated.
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