Journal ArticleDOI
Forces in atomic force microscopy in air and water
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TLDR
In this article, an atomic force microscope with an optical lever detection system was used to measure the absolute force applied by a tip on a surface, which can be as low as 10−9 N or less in water and 10−7 N in air.Abstract:
A new atomic force microscope, which combines a microfabricated cantilever with an optical lever detection system, now makes it possible to measure the absolute force applied by a tip on a surface. This absolute force has been measured as a function of distance (=position of the surface) in air and water over a range of 600 nm. In the absolute force versus distance curves there are two transitions from touching the surface to a total release in air caused by van der Waals interaction and surface tension. One transition is due to lifting off the surface; the other is due to lifting out of an adsorbed layer on the surface. In water there is just one transition due to lifting off the surface. There is also a transition in air and water when the totally released tip is pulled down to touch the surface as the surface and tip are brought together. Based on the force versus distance curves, we propose a procedure to set the lowest possible imaging force. It can now be as low as 10−9 N or less in water and 10−7 N...read more
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Force measurements with the atomic force microscope: Technique, interpretation and applications
TL;DR: The atomic force microscope (AFM) is not only used to image the topography of solid surfaces at high resolution but also to measure force-versus-distance curves as discussed by the authors, which provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities.
Journal ArticleDOI
Nanotubes as nanoprobes in scanning probe microscopy
TL;DR: In this article, it was shown that carbon nanotubes might constitute well defined tips for scanning probe microscopy, and they were attached to the silicon cantilevers of conventional atomic force microscopes.
Journal ArticleDOI
Stretching and Breaking of Ultrathin MoS2
TL;DR: In this paper, the stiffness and breaking strength of monolayer MoS2, a new semiconducting analogue of graphene, was investigated. But the results were limited to the case of single and bilayer membranes, and the strength of strongest membranes was only 11% of its Young's modulus.
Journal ArticleDOI
Direct measurement of colloidal forces using an atomic force microscope
TL;DR: In this article, the authors used the atomic force microscope to measure the forces between a planar surface and an individual colloid particle, a silica sphere of radius 3.5 µm, attached to the force sensor in the microscope and measured in solutions of sodium chloride.
Journal ArticleDOI
Force-distance curves by atomic force microscopy
Bruno Cappella,Giovanni Dietler +1 more
TL;DR: Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology.
References
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Journal ArticleDOI
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
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Atomic-scale friction of a tungsten tip on a graphite surface.
TL;DR: Using an atomic force microscope, atomic-scale features on the frictional force acting on a tungsten wire tip sliding on the basal plane of a graphite surface at low loads are observed.
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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
TL;DR: In this paper, a modified version of the atomic force microscope is introduced that enables a precise measurement of the force between a tip and a sample over a tip-sample distance range of 30-150 A.
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Novel optical approach to atomic force microscopy
Gerhard Meyer,Nabil M. Amer +1 more
TL;DR: In this article, a simple optical method for detecting the cantilever deflection in atomic force microscopy is described, and the method is incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, are successfully performed.
Journal ArticleDOI
Imaging crystals, polymers, and processes in water with the atomic force microscope.
Barney Drake,Craig Prater,A. L. Weisenhorn,Scot A. C. Gould,T. R. Albrecht,Calvin F. Quate,David S. Cannell,Helen G. Hansma,Paul K. Hansma +8 more
TL;DR: Images of mica demonstrate that atomic resolution is possible on rigid materials, thus opening the possibility of atomic-scale corrosion experiments on nonconductors and showing the potential of the AFM for revealing the structure of molecules important in biology and medicine.