Journal ArticleDOI
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
TLDR
It is demonstrated that a 512-byte SRAM fingerprint contains sufficient entropy to generate 128-bit true random numbers and that the generated numbers pass the NIST tests for runs, approximate entropy, and block frequency.Abstract:
Intermittently powered applications create a need for low-cost security and privacy in potentially hostile environments, supported by primitives including identification and random number generation. Our measurements show that power-up of SRAM produces a physical fingerprint. We propose a system of fingerprint extraction and random numbers in SRAM (FERNS) that harvests static identity and randomness from existing volatile CMOS memory without requiring any dedicated circuitry. The identity results from manufacture-time physically random device threshold voltage mismatch, and the random numbers result from runtime physically random noise. We use experimental data from high-performance SRAM chips and the embedded SRAM of the WISP UHF RFID tag to validate the principles behind FERNS. For the SRAM chip, we demonstrate that 8-byte fingerprints can uniquely identify circuits among a population of 5,120 instances and extrapolate that 24-byte fingerprints would uniquely identify all instances ever produced. Using a smaller population, we demonstrate similar identifying ability from the embedded SRAM. In addition to identification, we show that SRAM fingerprints capture noise, enabling true random number generation. We demonstrate that a 512-byte SRAM fingerprint contains sufficient entropy to generate 128-bit true random numbers and that the generated numbers pass the NIST tests for runs, approximate entropy, and block frequency.read more
Citations
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Journal ArticleDOI
Physical Unclonable Functions and Applications: A Tutorial
TL;DR: This paper motivates the use of PUFs versus conventional secure nonvolatile memories, defines the two primary PUF types, and describes strong and weak PUF implementations and their use for low-cost authentication and key generation applications.
Journal ArticleDOI
Memory devices and applications for in-memory computing
TL;DR: This Review provides an overview of memory devices and the key computational primitives enabled by these memory devices as well as their applications spanning scientific computing, signal processing, optimization, machine learning, deep learning and stochastic computing.
Proceedings ArticleDOI
Modeling attacks on physical unclonable functions
TL;DR: In this article, numerical modeling attacks are used to break the security of physical unclonable functions (PUFs) by constructing a computer algorithm which behaves indistinguishably from the original PUF on almost all CRPs.
Journal ArticleDOI
A Primer on Hardware Security: Models, Methods, and Metrics
TL;DR: This paper systematizes the current knowledge in this emerging field, including a classification of threat models, state-of-the-art defenses, and evaluation metrics for important hardware-based attacks.
Book ChapterDOI
Physically Unclonable Functions: A Study on the State of the Art and Future Research Directions
Roel Maes,Ingrid Verbauwhede +1 more
TL;DR: The practical relevance of PUFs for security applications was recognized from the start, with a special focus on the promising properties of physical unclonability and tamper evidence.
References
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A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
TL;DR: Some criteria for characterizing and selecting appropriate generators and some recommended statistical tests are provided, as a first step in determining whether or not a generator is suitable for a particular cryptographic application.
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Universal classes of hash functions
TL;DR: An input independent average linear time algorithm for storage and retrieval on keys that makes a random choice of hash function from a suitable class of hash functions.
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Thermal Agitation of Electric Charge in Conductors
TL;DR: In this article, the electromotive force due to thermal agitation in conductors is calculated by means of principles in thermodynamics and statistical mechanics, and the results obtained agree with results obtained experimentally.
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Digital integrated circuits: a design perspective
TL;DR: In this paper, the authors present a survey of the state-of-the-art in the field of digital integrated circuits, focusing on the following: 1. A Historical Perspective. 2. A CIRCUIT PERSPECTIVE.