BookDOI
Scanning transmission electron microscopy of nanostructures
S. J. Pennycook,Maria Varela,M. F. Chisholm,Albina Y. Borisevich,Andrew R. Lupini,K. van Benthem,Mark P. Oxley,Weidong Luo,James R. McBride,Sandra J. Rosenthal,Sang Ho Oh,David L. Sales,Sergio I. Molina,Karl Sohlberg,Sokrates T. Pantelides +14 more
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The article was published on 2010-02-11. It has received 10 citations till now. The article focuses on the topics: Scanning transmission electron microscopy & Electron beam-induced deposition.read more
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Journal ArticleDOI
Towards atomic and close-to-atomic scale manufacturing
Fengzhou Fang,Fengzhou Fang,Nan Zhang,Dongming Guo,Kornel F. Ehmann,Benny C.F. Cheung,Kui Liu,Kazuya Yamamura +7 more
TL;DR: Feng et al. as discussed by the authors reviewed the development of atomic and close to atomic scale manufacturing (ACSM) based on atomic level operation modes in subtractive, transformative, and additive manufacturing processes.
Journal ArticleDOI
Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems.
Stephen J. Pennycook,Stephen J. Pennycook,M. F. Chisholm,Andrew R. Lupini,Maria Varela,Albina Y. Borisevich,Mark P. Oxley,Mark P. Oxley,Weidong Luo,Weidong Luo,K. van Benthem,Sang Ho Oh,David L. Sales,Sergio I. Molina,Javier Garcia-Barriocanal,Carlos León,Jacobo Santamaria,Sergey N. Rashkeev,Sokrates T. Pantelides,Sokrates T. Pantelides +19 more
TL;DR: Recent advances in aberration-corrected scanning transmission electron microscopy are reviewed with reference to several applications of relevance to energy, the origin of the low-temperature catalytic activity of nanophase Au, the nucleation and growth of semiconducting nanowires, and theorigin of the eight orders of magnitude increased ionic conductivity in oxide superlattices are reviewed.
Journal ArticleDOI
The mechanism for the colour change of iron chromium black pigments in glazes through transmission electron microscopy techniques
TL;DR: In this paper, the authors used focused ion beam (FIB) sample preparation technique followed by the use of analytical transmission electron microscopy (TEM) characterisation techniques to identify the formation of a reaction layer between the pigment and glaze.
Journal ArticleDOI
Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials
TL;DR: In this paper, the authors highlight the potential when using latest scanning/transmission electron microscopy (S/TEM) methodology optimized for atomic scale investigations and how this can be extended to in situ studies of interfacial effects.
Journal ArticleDOI
New views of materials through aberration-corrected scanning transmission electron microscopy
S. J. Pennycook,Maria Varela +1 more
TL;DR: A number of examples are reviewed, mostly from the field of complex oxides, of how the successful correction of third-order and fifth-order aberrations has enhanced the capabilities of the scanning transmission electron microscope.