Dong Myong Kim

TL;DR: In this article, a sub-bandgap optical subthreshold current spectroscopy (OSCS) was proposed for extracting the energy distribution of interface trap density (Dit) in nitride-based charge trap flash (CTF) memory devices.

TL;DR: In this paper, a sub-bandgap photonic capacitance-voltage method (PCVM) is proposed for the energy distribution of interface traps at the SiO2/low temperature poly-silicon (LTPS) junction interface in LTPS thin-film transistors.

TL;DR: An efficient circuit technique to minimize the hardware consumption for a digital fourth-order single loop ΔΣ modulator that employs a simple bit-shifting and the ROM selection scheme for multiplications and the new buffer-and-routing ROM structure is described.

TL;DR: In this article, the effects of negative and positive bias stability with respect to the anion composition of Zn-O-N thin-film transistors were investigated, and the negative bias stress test results showed that the threshold voltage shift was high for ZnON devices with high nitrogen composition.

TL;DR: The proposed physical-based technique showed better accuracy and compatibility with amorphous oxide semiconductor (AOS) TFTs compared with classical empirically based methods.