D
Dong Myong Kim
Researcher at Kookmin University
Publications - 233
Citations - 4036
Dong Myong Kim is an academic researcher from Kookmin University. The author has contributed to research in topics: Thin-film transistor & Threshold voltage. The author has an hindex of 25, co-authored 216 publications receiving 3378 citations.
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Journal ArticleDOI
Study on the Photoresponse of Amorphous In–Ga–Zn–O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation
Jun Tae Jang,Jozeph Park,Byung Du Ahn,Dong Myong Kim,Sung-Jin Choi,Hyun-Suk Kim,Dae Hwan Kim +6 more
TL;DR: The concept of activation energy window (AEW) is introduced to explain the occurrence of PPC effects by photoinduced electron doping, which is likely to be associated with the formation of peroxides in the semiconductor.
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Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)
Yongwoo Jeon,Sungchul Kim,Sangwon Lee,Dong Myong Kim,Dae Hwan Kim,Jae-Chul Park,Chang Jung Kim,Ihun Song,Youngsoo Park,U-In Chung,Je-Hun Lee,Byung Du Ahn,Sei Yong Park,Jun-Hyun Park,Joo-Han Kim +14 more
TL;DR: In this paper, the authors proposed the Subgap Density of states (DOS)-based Amorphous Oxide TFT Simulator (DeAOTS) for amorphous indium-gallium-zincoxide (a-IGZO) TFTs.
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Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors
Sungchul Kim,Yongwoo Jeon,Yongsik Kim,Dongsik Kong,Hyun Kwang Jung,Minkyung Bae,Je-Hun Lee,Byung Du Ahn,Sei Yong Park,Jun-Hyun Park,Jae-Woo Park,Hyuck-In Kwon,Dong Myong Kim,Dae Hwan Kim +13 more
TL;DR: In this article, the effect of O2 flow rate during channel deposition is investigated on the electrical instability of the amorphous indium-gallium-zinc oxide (a-IGZO) thin-film transistors (TFTs) under positive gate bias stresses.
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Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range
Yongsik Kim,Minkyung Bae,Woojoon Kim,Dongsik Kong,Hyun Kwang Jung,Hyungtak Kim,Sun-Woong Kim,Dong Myong Kim,Dae Hwan Kim +8 more
TL;DR: In this article, a combination of the multifrequency C-V and the generation-recombination current spectroscopy is proposed for a complete extraction of density of states (DOS) in amorphous InGaZnO thin-film transistors (a-IGZO TFTs) over the full subband-gap energy range (EV ≤ E ≤ EC) including the interface trap density between the gate oxide and the active layer.
Journal ArticleDOI
A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor
Jieun Lee,Jaeman Jang,Bongsik Choi,Jinsu Yoon,Jee-Yeon Kim,Yang-Kyu Choi,Dong Myong Kim,Dae Hwan Kim,Sung-Jin Choi +8 more
TL;DR: This study demonstrates a hybrid biosensor comprised of a silicon nanowire (SiNW) integrated with an amplifier MOSFET to improve the current response of field-effect-transistor (FET)-based biosensors.